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1. (WO2001088923) IMPROVED CALIBRATION TECHNIQUE FOR MEMORY DEVICES

Pub. No.:    WO/2001/088923    International Application No.:    PCT/US2001/015459
Publication Date: Nov 22, 2001 International Filing Date: May 14, 2001
IPC: G11C 7/10
G11C 7/20
G11C 7/22
G11C 11/4072
Applicants: MICRON TECHNOLOGY, INC.
Inventors: JOHNSON, Brian
KEETH, Brent
Title: IMPROVED CALIBRATION TECHNIQUE FOR MEMORY DEVICES
Abstract:
Disclosed is an improved start-up/reset calibration apparatus and method for use in a memory device. One of a plurality of data paths is bit wise calibrated relative to a clock signal and thereafter others of the plurality of data paths are bit wise aligned to a previously calibrated data path to produce serial and parallel bit alignment on all data paths.