Search International and National Patent Collections

1. (WO2001033920) NONDESTRUCTIVE INSPECTION APPARATUS

Pub. No.:    WO/2001/033920    International Application No.:    PCT/JP2000/007561
Publication Date: Fri May 11 01:59:59 CEST 2001 International Filing Date: Sat Oct 28 01:59:59 CEST 2000
IPC: G01N 23/04
H05G 1/06
H05G 1/10
Applicants: HAMAMATSU PHOTONICS K.K.

OCHIAI, Yutaka

Inventors: OCHIAI, Yutaka

Title: NONDESTRUCTIVE INSPECTION APPARATUS
Abstract:
A nondestructive inspection apparatus with integrated power supply comprises a molded power supply section (14) having a resin-molded high voltage (e.g. 160 kV) generating section (15) secured to the base of a tubular section (2). The durability and handlability are improved by omitting a high voltage cable. Since the high voltage generating section (15) is confined in a molding resin, the degree of freedom in the arrangement of the high voltage generating section (15) within the mold is enhanced significantly. Furthermore, an X-ray generating unit (1) can be installed stably in the nondestructive inspection apparatus (70) by disposing the heavy molded power supply section (14) under a target (10).