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1. (WO2001004646) APPARATUS FOR MEASUREMENT OF CRITICAL CURRENT IN SUPERCONDUCTIVE TAPES
Latest bibliographic data on file with the International Bureau   

Pub. No.: WO/2001/004646 International Application No.: PCT/US2000/019234
Publication Date: 18.01.2001 International Filing Date: 13.07.2000
Chapter 2 Demand Filed: 07.02.2001
IPC:
G01R 33/12 (2006.01)
Applicants: LOS ALAMOS NATIONAL LABORATORY[US/US]; LC/BPL, MS D412 P.O. Box 1663 Los Alamos, NM 87545, US
Inventors: COULTER, J., Yates; US
DEPAULA, Raymond; US
Agent: COTTRELL, Bruce, H. ; Los Alamos National Laboratory LC/BPL, MS D412 Los Alamos, NM 87545, US
Priority Data:
60/143,78113.07.1999US
Title (EN) APPARATUS FOR MEASUREMENT OF CRITICAL CURRENT IN SUPERCONDUCTIVE TAPES
(FR) APPAREIL PERMETTANT DE MESURER LE COURANT CRITIQUE DANS DES RUBANS SUPRACONDUCTEURS
Abstract: front page image
(EN) A cryogenic linear positioner which is primarily used for characterizing coated conductor critical current homogeneity at 75K is disclosed. Additionally, this tool can be used to measure the positional dependence of the coated conductor resistance at room temperature, and the room temperature resistance of the underlying YBCO coating without the overlaying protective cover of silver.
(FR) L'invention concerne un positionneur linéaire cryogénique servant principalement à caractériser l'homogénéité du courant critique à 75K d'un conducteur enrobé. Cet outil peut également servir à mesurer la dépendance de positionnement de la résistance du conducteur enrobé à température ambiante, ainsi que la résistance à température ambiante du revêtement de YBCO sous-jacent en l'absence de revêtement protecteur sous-jacent en argent.
Designated States: AE, AL, AM, AT, AU, AZ, BA, BB, BG, BR, BY, CA, CH, CN, CR, CU, CZ, DE, DK, DM, EE, ES, FI, GB, GD, GE, GH, GM, HR, HU, ID, IL, IN, IS, JP, KE, KG, KP, KR, KZ, LC, LK, LR, LS, LT, LU, LV, MA, MD, MG, MK, MN, MW, MX, NO, NZ, PL, PT, RO, RU, SD, SE, SG, SI, SK, SL, TJ, TM, TR, TT, TZ, UA, UG, UZ, VN, YU, ZA, ZW
African Regional Intellectual Property Organization (ARIPO) (GH, GM, KE, LS, MW, MZ, SD, SL, SZ, TZ, UG, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (EPO) (AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LU, MC, NL, PT, SE)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GW, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)