Search International and National Patent Collections

1. (WO2001001245) INPUT/OUTPUT PROBING APPARATUS AND INPUT/OUTPUT PROBING METHOD USING THE SAME, AND MIXED EMULATION/SIMULATION METHOD BASED ON IT

Pub. No.:    WO/2001/001245    International Application No.:    PCT/KR2000/000670
Publication Date: Fri Jan 05 00:59:59 CET 2001 International Filing Date: Tue Jun 27 01:59:59 CEST 2000
IPC: G01R 31/317
G01R 31/3183
G06F 17/50
Applicants: YANG, Sei-Yang
Inventors: YANG, Sei-Yang
Title: INPUT/OUTPUT PROBING APPARATUS AND INPUT/OUTPUT PROBING METHOD USING THE SAME, AND MIXED EMULATION/SIMULATION METHOD BASED ON IT
Abstract:
An interactive environment is provided for integrated circuit (IC) designers to do an emulation session on a hardware accelerator (111) and then move to simulator (131), and vice versa. An aspect of the present inventive solution swaps memory state and logic storage node state (such as flip-flops and latches) between the accelerator (111) and simulator (131). A complete context switch is performed to create a time shared environment on hardware accelerator (111) so that multiple IC designers can access and use the accelerator. Multiple memory pages can be incorporated to minimize state swap time. Multiple accelerators (111) can be interconnected with a plurality of simulators (131) and a plurality of workstations (101) to allow multiple designers to do interactive operations and allow shifting back and forth between hardware emulation and software simulation.