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1. WO2000041248 - SEMICONDUCTOR POSITION DETECTOR AND RANGE FINDER USING THE SAME

Publication Number WO/2000/041248
Publication Date 13.07.2000
International Application No. PCT/JP1999/006756
International Filing Date 02.12.1999
Chapter 2 Demand Filed 02.12.1999
IPC
G01B 11/00 2006.01
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
11Measuring arrangements characterised by the use of optical means
G01B 11/14 2006.01
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
11Measuring arrangements characterised by the use of optical means
14for measuring distance or clearance between spaced objects or spaced apertures
G01C 3/00 2006.01
GPHYSICS
01MEASURING; TESTING
CMEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
3Measuring distances in line of sight; Optical rangefinders
G01C 3/06 2006.01
GPHYSICS
01MEASURING; TESTING
CMEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
3Measuring distances in line of sight; Optical rangefinders
02Details
06Use of electric means to obtain final indication
G02B 7/30 2006.01
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
7Mountings, adjusting means, or light-tight connections, for optical elements
28Systems for automatic generation of focusing signals
30using parallactic triangle with a base line
G02B 7/32 2006.01
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
7Mountings, adjusting means, or light-tight connections, for optical elements
28Systems for automatic generation of focusing signals
30using parallactic triangle with a base line
32using active means, e.g. light emitter
CPC
H01L 31/02024
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
31Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof
02Details
02016Circuit arrangements of general character for the devices
02019for devices characterised by at least one potential jump barrier or surface barrier
02024Position sensitive and lateral effect photodetectors; Quadrant photodiodes
H01L 31/03529
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
31Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof
0248characterised by their semiconductor bodies
0352characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions
035272characterised by at least one potential jump barrier or surface barrier
03529Shape of the potential jump barrier or surface barrier
Y02E 10/50
YSECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
10Energy generation through renewable energy sources
50Photovoltaic [PV] energy
Applicants
  • HAMAMATSU PHOTONICS K.K. [JP/JP]; 1126-1, Ichino-cho Hamamatsu-shi Shizuoka-ken 435-8558, JP (AllExceptUS)
  • TAKESHITA, Tatsuo [JP/JP]; JP (UsOnly)
  • SAKAKIBARA, Masayuki [JP/JP]; JP (UsOnly)
Inventors
  • TAKESHITA, Tatsuo; JP
  • SAKAKIBARA, Masayuki; JP
Agents
  • HASEGAWA, Yoshiki ; Soei Patent and Law Firm Okura-Honkan 6-12, Ginza 2-chome Chuo-ku Tokyo 104-0061, JP
Priority Data
10/37360028.12.1998JP
Publication Language Japanese (JA)
Filing Language Japanese (JA)
Designated States
Title
(EN) SEMICONDUCTOR POSITION DETECTOR AND RANGE FINDER USING THE SAME
(FR) DETECTEUR DE POSITION DE SEMI-CONDUCTEUR ET TELEMETRE UTILISANT CELUI-CI
Abstract
(EN)
The light receiving surface of a PSD (14) in the range finder is formed with a main conductive layer (24) extending in a base line direction and a plurality of branch conductive layers (26) arranged in the base line direction and connected to the main conductive layer (24), each branch conductive layer (26) forming an angle of 45° with respect to the base line direction. An LED (12) is capable of projecting slit light extending at an angle of 45° with respect to the base line direction.
(FR)
La surface de récepteur optique d'un PSD (14) de télémètre est formée à l'aide d'une couche conductrice principale (24) s'étendant dans un sens de ligne de référence, et de plusieurs couches conductrices secondaires (26) aménagées dans le sens de la ligne de référence et connectées à la couche conductrice principale (24), chaque couche conductrice secondaire (26) formant un angle de 45° par rapport à la ligne de référence. Une DEL (12) est capable de projeter par une fente de la lumière s'étendant selon un angle de 45° par rapport à la ligne de référence.
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