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1. WO2000040983 - METHOD FOR CONTROLLING IC HANDLER AND CONTROL SYSTEM USING THE SAME

Publication Number WO/2000/040983
Publication Date 13.07.2000
International Application No. PCT/JP1999/007413
International Filing Date 28.12.1999
IPC
G01R 31/28 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
CPC
G01R 31/2851
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
2851Testing of integrated circuits [IC]
G01R 31/2887
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
2851Testing of integrated circuits [IC]
2886Features relating to contacting the IC under test, e.g. probe heads; chucks
2887involving moving the probe head or the IC under test; docking stations
G01R 31/2891
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
2851Testing of integrated circuits [IC]
2886Features relating to contacting the IC under test, e.g. probe heads; chucks
2891related to sensing or controlling of force, position, temperature
G01R 31/2893
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
2851Testing of integrated circuits [IC]
2893Handling, conveying or loading, e.g. belts, boats, vacuum fingers
Applicants
  • DAITO CORPORATION [JP/JP]; 46-7, Minamiota 1-chome Minami-ku, Yokohama-shi, Kanagawa 232-0006, JP (AllExceptUS)
  • OHNO, Tomonori [JP/JP]; JP (UsOnly)
  • KURIHARA, Mitsugu [JP/JP]; JP (UsOnly)
Inventors
  • OHNO, Tomonori; JP
  • KURIHARA, Mitsugu; JP
Agents
  • SUZUYE, Takehiko ; Suzuye & Suzuye 7-2, Kasumigaseki 3-chome Chiyoda-ku, Tokyo 100-0013, JP
Priority Data
10/37854931.12.1998JP
Publication Language Japanese (JA)
Filing Language Japanese (JA)
Designated States
Title
(EN) METHOD FOR CONTROLLING IC HANDLER AND CONTROL SYSTEM USING THE SAME
(FR) PROCEDE DE COMMANDE DE MANIPULATION D'IC, SYSTEME DE COMMANDE DANS LEQUEL LEDIT PROCEDE EST UTILISE
Abstract
(EN)
The pressing force, operation speed, and displacement of a test hand are properly controlled according to the type of IC and the type of socket. The method comprises sensing the load, acceleration or speed, and push displacement of the IC so as to compare the pressing force exerted on the IC (5) placed on a socket (2) by means of a pusher (8) of a test hand (1) with an allowable pressing force determined from the synthetic spring constant of the socket (2) and the IC (5), and controlling the movement of the test hand (1) according to the result of the comparison so as to keep the pressing force below the allowable pressing force.
(FR)
La force de pression, la vitesse de fonctionnement et le déplacement d'un bras d'essai sont commandés correctement selon le type de CI et le type de support. Ledit procédé consiste à mesurer la charge, l'accélération ou la vitesse, et le déplacement par poussée du CI, de sorte que la force de pression exercée sur le CI (5) placé sur un support (2) au moyen du poussoir (2) d'un bras d'essai (1), soit comparée avec une force de pression autorisée déterminée à partir de la constante de ressort synthétique du support (2) et du CI (5), et à commander le mouvement du bras d'essai (1) en fonction du résultat de la comparaison, de manière que la force de pression soit maintenue au-dessous de la force de pression autorisée.
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