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1. WO2000040952 - DEVICE FOR THE PRECISION ROTATION OF SAMPLES

Publication Number WO/2000/040952
Publication Date 13.07.2000
International Application No. PCT/EP2000/000088
International Filing Date 07.01.2000
Chapter 2 Demand Filed 02.08.2000
IPC
G01N 23/20 2006.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/-G01N17/178
20by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
H05H 7/00 2006.01
HELECTRICITY
05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
HPLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY- CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
7Details of devices of the types covered by groups H05H9/-H05H13/102
CPC
G01N 23/20016
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00G01N17/00, G01N21/00 or G01N22/00
20by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
20008Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
20016Goniometers
H05H 7/00
HELECTRICITY
05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
HPLASMA TECHNIQUE
7Details of devices of the types covered by groups H05H9/00, H05H11/00, H05H13/00
Applicants
  • EUROPÄISCHES LABORATORIUM FÜR MOLEKULARBIOLOGIE (EMBL) [DE/DE]; Meyerhofstrasse 1 D-69117 Heidelberg, DE (AllExceptUS)
  • CIPRIANI, Florent [FR/FR]; FR (UsOnly)
  • CASTAGNA, Jean, Charles [FR/FR]; FR (UsOnly)
Inventors
  • CIPRIANI, Florent; FR
  • CASTAGNA, Jean, Charles; FR
Agents
  • WEICKMANN, H. ; Kopernikusstrasse 9 D-81679 München, DE
Priority Data
199 00 346.707.01.1999DE
Publication Language German (DE)
Filing Language German (DE)
Designated States
Title
(DE) PRÄZISIONS-PROBENDREHVORRICHTUNG
(EN) DEVICE FOR THE PRECISION ROTATION OF SAMPLES
(FR) DISPOSITIF D'ENTRAINEMENT EN ROTATION DE PRECISION POUR ECHANTILLON
Abstract
(DE)
Es wird eine Präzisions-Probendrehvorrichtung an einem Diffraktometer, insbesondere für Röntgen- bzw. Synchrotronstreuversuche, vorgeschlagen, umfassend: ein an einem Ende einer motorisch antreibbaren Drehwelle (22) gehaltenes und in einer zur Drehachse der Drehwelle (22) orthogonalen Ebene verschiebbares Zentrierelement (26); einen an dem Zentrierelement (26) befestigten oder mit diesem einstückigen Probenhalter (30) zur Halterung einer Probe (32) im wesentlichen zentrisch zur Drehachse in einem Röntgen- bzw. Synchrotronstrahl (S); wenigstens einen im Bereich des Zentrierelements (26) angeordneten Mikrometerfinger (36), der durch eine Mikrometerfinger-Antriebsvorrichtung orthogonal zur Drehachse der Drehwelle (22) positionierbar ist.
(EN)
The invention relates to a device for the precision rotation of samples, which device is mounted on a diffractometer and used notably for X-ray or synchrotron radiation diffraction experiments. Said device comprises: a centering element (26) which is held at one end of a motor-driven rotating shaft (22) and can be displaced in a plane orthogonal to the axis of rotation of the rotating shaft (22); a sample holder (30) which is fixed to or formed as a single piece with the centering element (26) and holds a sample (32) substantially centrally in relation to the axis of rotation in an X-ray or synchrotron radiation beam (S); and at least one micrometric finger (36) which is arranged in the area of the centering element (26) and by means of a micrometric finger drive device can be positioned orthogonally to the axis of rotation of the rotating shaft (22).
(FR)
L'invention concerne un dispositif d'entraînement en rotation de précision pour échantillon, monté sur un diffractomètre, en particulier pour la réalisation d'examens par dispersion de rayons X ou d'un rayonnement synchrotron, ce dispositif comprenant: un élément de centrage (26) fixé à une extrémité d'un arbre rotatif (22) entraîné par moteur, et pouvant être déplacé dans un plan perpendiculaire à l'axe de rotation de l'arbre rotatif (22); un porte-échantillon (30) fixé audit élément de centrage (26) ou ne formant qu'une seule pièce avec celui-ci, destiné à porter un échantillon (32) sensiblement centralement par rapport à l'axe de rotation, dans des rayons X ou dans un rayonnement synchrotron (S); et au moins un doigt micrométrique (36), placé dans la zone de l'élément de centrage (26), qui peut être positionné perpendiculairement à l'axe de rotation de l'arbre rotatif (22) par un dispositif d'entraînement de doigt micrométrique.
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