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1. WO2000039523 - SHADOW MOIRE SURFACE TOPOLOGY INSPECTION WITH CALIBRATION SAMPLES

Publication Number WO/2000/039523
Publication Date 06.07.2000
International Application No. PCT/GB1999/004385
International Filing Date 20.12.1999
Chapter 2 Demand Filed 01.07.2000
IPC
G01B 11/16 2006.01
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
11Measuring arrangements characterised by the use of optical means
16for measuring the deformation in a solid, e.g. optical strain gauge
CPC
G01B 11/16
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
11Measuring arrangements characterised by the use of optical means
16for measuring the deformation in a solid, e.g. optical strain gauge
Applicants
  • BAE SYSTEMS PLC [GB/GB]; Warwick House Farnborough Aerospace Centre P.O. Box 87 Farnborough, Hampshire GU14 6YU, GB (AllExceptUS)
  • O'BRIEN, Edwin, William [GB/GB]; GB (UsOnly)
  • IBBOTSON, Andrew, Robert [GB/GB]; GB (UsOnly)
Inventors
  • O'BRIEN, Edwin, William; GB
  • IBBOTSON, Andrew, Robert; GB
Agents
  • EDIS, Ronald, Malcolm ; BAE Systems plc Group IP Department Lancaster House, P.O. Box 87 Farnborough Aerospace Centre Farnborough, Hampshire GU14 6YU, GB
Priority Data
9828474.824.12.1998GB
Publication Language English (EN)
Filing Language English (EN)
Designated States
Title
(EN) SHADOW MOIRE SURFACE TOPOLOGY INSPECTION WITH CALIBRATION SAMPLES
(FR) MESURE DE LA TOPOLOGIE D'UNE SURFACE AU MOYEN D'UN RESEAU MOIRE UTILISANT DES ECHANTILLONS DE REFERENCE
Abstract
(EN)
Apparatus and a method for inspecting a tpology of a surface (2) of a structural member (1) are provided. The degree to which a known type of stress has been applied to the member may be ascertained using a Moiré grid (8). The method involves providing a range of calibration samples of structurally equivalent members, the samples each having been subject to the known type of stress to a differing respective degree. Measurements taken using the apparatus and method of the invention are then compared with measurements taken from a calibration sample to determine the amount of stress which has been applied.
(FR)
L'invention concerne un procédé de contrôle topologique d'une surface (2) d'un élément de structure (1). Le niveau auquel un type de contrainte connu a été appliquée sur ledit élément est mesuré au moyen d'un réseau moiré (8). Le procédé consiste à obtenir une gamme d'échantillons de référence d'éléments structuralement équivalents, chaque échantillon étant soumis audit type de contrainte connu, à divers degrés respectifs. Les mesures prises au moyen de l'appareil et du procédé de l'invention sont ensuite comparées avec des mesures obtenues d'un échantillon de référence pour déterminer le niveau de contrainte appliqué.
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