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Machine translation
1. (WO2000025111) APPARATUS MEASURING REFLECTANCE OF STRIPS HAVING NON-UNIFORM COLOR
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2000/025111    International Application No.:    PCT/US1999/025169
Publication Date: 04.05.2000 International Filing Date: 27.10.1999
Chapter 2 Demand Filed:    23.05.2000    
IPC:
G01N 21/47 (2006.01), G01N 21/86 (2006.01)
Applicants: UMM ELECTRONICS, INC. [US/US]; 6911 Hillsdale Court Indianapolis, IN 46250 (US) (For All Designated States Except US).
RIEDEL, Richard, A. [US/US]; (US) (For US Only).
HUTCHISON, James [US/US]; (US) (For US Only)
Inventors: RIEDEL, Richard, A.; (US).
HUTCHISON, James; (US)
Agent: COLE, Troy, J.; Woodard, Emhardt, Naughton, Moriarty & McNett Suite 3700 Bank One Center/Tower 111 Monument Circle Indianapolis, IN 46204 (US)
Priority Data:
09/179,500 27.10.1998 US
Title (EN) APPARATUS MEASURING REFLECTANCE OF STRIPS HAVING NON-UNIFORM COLOR
(FR) APPAREIL POUR MESURER LA REFLECTANCE DE BANDES A COULEUR NON-UNIFORME
Abstract: front page image
(EN)An optical system (20) for measuring the reflectance of flat strips having potentially optically non-uniform surfaces. In one embodiment the system includes an array of discrete light sources (32), wherein each light source is driven by its own individual current, such that the pattern reflected onto a photodetector (38) is substantially uniform in intensity.
(FR)Système optique (20) qui mesure la réflectance de bandes plates possédant potentiellement des surfaces optiquement non-uniformes. Dans un certain mode de réalisation, le système comprend un réseau de sources lumineuses distinctes (32), où chaque source lumineuse est sous l'effet de son propre courant individuel, de façon que le motif réfléchi sur un photodétecteur (38) soit d'intensité sensiblement uniforme.
Designated States: AE, AL, AM, AT, AU, AZ, BA, BB, BG, BR, BY, CA, CH, CN, CR, CU, CZ, DE, DK, EE, ES, FI, GB, GD, GE, GH, GM, HR, HU, ID, IL, IN, IS, JP, KE, KG, KP, KR, KZ, LC, LK, LR, LS, LT, LU, LV, MA, MD, MG, MK, MN, MW, MX, NO, NZ, PL, PT, RO, RU, SD, SE, SG, SI, SK, SL, TJ, TM, TR, TT, TZ, UA, UG, US, UZ, VN, YU, ZA, ZW.
African Regional Intellectual Property Organization (GH, GM, KE, LS, MW, SD, SL, SZ, TZ, UG, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LU, MC, NL, PT, SE)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GW, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)