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1. WO1999032895 - APPARATUS AND METHOD FOR TESTING A DEVICE

Publication Number WO/1999/032895
Publication Date 01.07.1999
International Application No. PCT/US1998/027339
International Filing Date 21.12.1998
Chapter 2 Demand Filed 22.07.1999
IPC
G01R 1/04 2006.1
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types covered by groups G01R5/-G01R13/122
02General constructional details
04Housings; Supporting members; Arrangements of terminals
G01R 31/28 2006.1
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
CPC
G01R 1/0433
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
02General constructional details
04Housings; Supporting members; Arrangements of terminals
0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
0433Sockets for IC's or transistors
G01R 31/2886
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
2851Testing of integrated circuits [IC]
2886Features relating to contacting the IC under test, e.g. probe heads; chucks
Applicants
  • 3M INNOVATIVE PROPERTIES COMPANY [US]/[US] (AllExceptUS)
  • BUMB, Frank, E., Jr. [US]/[US] (UsOnly)
  • GATES, Geoffrey, W. [US]/[US] (UsOnly)
  • GOOD, David, C. [US]/[US] (UsOnly)
Inventors
  • BUMB, Frank, E., Jr.
  • GATES, Geoffrey, W.
  • GOOD, David, C.
Agents
  • FONSECA, Darla, P.
Priority Data
08/995,73422.12.1997US
Publication Language English (en)
Filing Language English (EN)
Designated States
Title
(EN) APPARATUS AND METHOD FOR TESTING A DEVICE
(FR) APPAREIL ET PROCEDE DE MISE A L'ESSAI D'UN DISPOSITIF
Abstract
(EN) An apparatus (20) for testing a device (26) including a plurality of elements (27) each having a contact surface (101) and a non-contact surface (102), the apparatus (20) comprising a base (21) for holding the device (26), the base (21) having a contact surface engageable with the contact surface (101) of each element (27), an actuator (23), a plurality of compliant members (28) carried by the actuator (23) to engage the non-contact surface (102) of each element (27), each compliant member (28) further including an aspect ratio of at least 1:1, and means (22) for exerting a force against the actuator (23), the aspect ratio for allowing the compliant members (28) to compensate for physical variations of the elements (27), provide compliance between the apparatus (20) and the elements (27) and substantial coplanarity between the contact surface (101) of each element and contact surface of the base (21) while allowing a sufficient focusing of force by the compliant members (28) against the non-contact surface (102) of each element (27) to provide contact between the contact surface (101) of each element and the contact surface of the base (21) without damaging the elements (27).
(FR) L'invention concerne un appareil (20) de mise à l'essai d'un dispositif (26) comportant une pluralité d'éléments (27) ayant chacun une surface de contact (101) et une surface de non-contact (102). Ledit appareil (20) comporte une base (21) conçue pour maintenir le dispositif (26), ladite base ayant une surface de contact pouvant entrer en contact avec la surface de contact (101) de chaque élément (27), un actionneur (23), une pluralité d'éléments souples (28) portés par l'actionneur (23) de façon à entrer en contact avec la surface de non-contact (102) de chaque élément (27), chaque élément souple (28) ayant par ailleurs un facteur de forme d'au moins 1:1, et un organe (22) conçu pour exercer une force sur l'actionneur (23), ledit facteur de forme permettant aux éléments souples (28) de compenser les variations physiques des éléments (27), d'assurer l'adaptation entre l'appareil (20) et les éléments (27) ainsi qu'une quasi-coplanarité entre la surface de contact (101) de chaque élément et la surface de contact de la base (21) tout en permettant une concentration suffisante de la force exercée par les éléments souples (28) sur la surface de non-contact (102) de chaque élément (27) de façon à assurer le contact entre la surface de contact (101) de chaque élément et la surface de contact de la base (21) sans endommager les éléments (27).
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