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1. (WO1999010705) A SCANNING PROBE MICROSCOPE SYSTEM REMOVABLY ATTACHED TO AN OPTICAL MICROSCOPE OBJECTIVE
Latest bibliographic data on file with the International Bureau

Pub. No.: WO/1999/010705 International Application No.: PCT/US1998/015758
Publication Date: 04.03.1999 International Filing Date: 29.07.1998
Chapter 2 Demand Filed: 09.03.1999
IPC:
G01B 7/34 (2006.01) ,G01Q 60/18 (2010.01) ,G02B 21/00 (2006.01)
G PHYSICS
01
MEASURING; TESTING
B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
7
Measuring arrangements characterised by the use of electric or magnetic means
34
for measuring roughness or irregularity of surfaces
G PHYSICS
01
MEASURING; TESTING
Q
SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]
60
Particular types of SPM [Scanning-Probe Microscopy] or apparatus therefor; Essential components thereof
18
SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
G PHYSICS
02
OPTICS
B
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21
Microscopes
Applicants:
THERMOMICROSCOPES CORP. [US/US]; 1171 Borregas Avenue Sunnyvale, CA 94089-1304, US (AT, AU, BE, CA, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, JP, KR, LU, MC, NL, PT, SE)
ALEXANDER, John, D. [US/US]; US (UsOnly)
TORTONESE, Marco [IT/US]; US (UsOnly)
NGUYEN, Thai [US/US]; US (UsOnly)
Inventors:
ALEXANDER, John, D.; US
TORTONESE, Marco; US
NGUYEN, Thai; US
Agent:
WEITZ, David, J.; Wilson Sonsini Goodrich & Rosati 650 Page Mill Road Palo Alto, CA 94304-1050, US
Priority Data:
08/916,57122.08.1997US
08/916,83022.08.1997US
09/119,80821.07.1998US
Title (EN) A SCANNING PROBE MICROSCOPE SYSTEM REMOVABLY ATTACHED TO AN OPTICAL MICROSCOPE OBJECTIVE
(FR) SYSTEME DE MICROSCOPE A BALAYAGE POUVANT ETRE FIXE AMOVIBLE SUR UN OBJECTIF DE MICROSCOPE OPTIQUE
Abstract:
(EN) A scanning probe microscope (SPM) system is provided, which is removably attachable to an objective of an optical microscope comprising an objective mounting adaptor, with an SPM assembly attached thereto by means of an SPM mounting adaptor and an SPM assembly and cap. The objective mounting adaptor and SPM assembly each include an optically transmissive region through which an optical view of the sample can be obtained by the microscope objective.
(FR) L'invention concerne un mécanisme de balayage destiné à un microscope à balayage. Le mécanisme comprend une partie fixe; une partie mobile; une pluralité de ressorts maintenant la partie mobile sur la partie fixe et produisant une tension qui s'oppose au déplacement de la partie mobile par rapport à la partie fixe, la tension produite par la pluralité de ressorts correspondant à une constante d'élasticité sensiblement linéaire sur la distance de balayage; et une ou plusieurs bobines mobiles fixées soit sur la partie mobile, soit sur la partie fixe, qui permettent de déplacer la partie mobile par rapport à la partie fixe dans une ou plusieurs directions orthogonales.
Designated States: AU, CA, JP, KR, US
European Patent Office (AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LU, MC, NL, PT, SE)
Publication Language: English (EN)
Filing Language: English (EN)