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1. (WO1999005511) METHOD AND DEVICE FOR ASCERTAINING CAUSE OF ABNORMALITY OF SURFACE OF MATERIAL

Pub. No.:    WO/1999/005511    International Application No.:    PCT/JP1998/003361
Publication Date: Fri Feb 05 00:59:59 CET 1999 International Filing Date: Wed Jul 29 01:59:59 CEST 1998
IPC: G01N 21/63
Applicants: NIPPON STEEL CORPORATION

SATO, Maki

KONDO, Hiroyuki

AIMOTO, Michihiro

FUKUI, Isao

Inventors: SATO, Maki

KONDO, Hiroyuki

AIMOTO, Michihiro

FUKUI, Isao

Title: METHOD AND DEVICE FOR ASCERTAINING CAUSE OF ABNORMALITY OF SURFACE OF MATERIAL
Abstract:
A method for ascertaining the cause of abnormality of the surface of a material, comprising fixing the position on which a pulse laser beam is projected in an abnormal portion of the surface of a material, projecting a pulse laser beam on that position, projecting a pulse laser beam on a normal portion of the surface, comparing the spectrum obtained by spectral analysis of the light emitted from the irradiated abnormal portion with that of the light emitted from the irradiated normal portion, and ascertaining the cause of the abnormality based on chemical elements present in the abnormal and normal portions and on the difference between the intensities of lights emitted from the abnormal and normal portions. The pulse laser beam is repetitively projected to make a hole deep into the abnormal portion inside the material.