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1. (WO1998049565) INTEGRATED CIRCUIT TESTER WITH COMPENSATION FOR LEAKAGE CURRENT
Latest bibliographic data on file with the International Bureau

Pub. No.: WO/1998/049565 International Application No.: PCT/US1998/008682
Publication Date: 05.11.1998 International Filing Date: 29.04.1998
Chapter 2 Demand Filed: 09.11.1998
IPC:
G01R 31/30 (2006.01) ,G01R 31/319 (2006.01)
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28
Testing of electronic circuits, e.g. by signal tracer
30
Marginal testing, e.g. by varying supply voltage
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28
Testing of electronic circuits, e.g. by signal tracer
317
Testing of digital circuits
3181
Functional testing
319
Tester hardware, i.e. output processing circuits
Applicants:
CREDENCE SYSTEMS CORPORATION [US/US]; 215 Fourier Avenue Fremont, CA 94539, US
Inventors:
CURRIN, Jeffrey, D.; US
PUN, Henry, Y.; US
Agent:
SMITH-HILL, John; Smith-Hill and Bedell, P.C. Suite 104 12670 NW Barnes Road Portland, OR 97229, US
Priority Data:
08/846,77630.04.1997US
Title (EN) INTEGRATED CIRCUIT TESTER WITH COMPENSATION FOR LEAKAGE CURRENT
(FR) TESTEUR DE CIRCUITS INTEGRES COMPENSATION DU COURANT DE FUITE
Abstract:
(EN) In an integrated circuit tester module (16), pin electronics circuitry (20) supplies leakage current to a circuit node which is connected to a signal pin (2) of a device under test (6). The leakage current is compensated by connecting the circuit node to a voltage source (VDD) at a first potential level, supplying current (26) to the circuit node from a second potential level, and measuring current supplied to the circuit node from the voltage source. The second potential level is selectively varied in a manner such as to reduce the current supplied from the voltage source substantially to zero. The circuit node is then disconnected from the voltage source.
(FR) L'invention concerne un module testeur de circuits intégrés (16) dans lequel un circuit électronique de broche (20) fourni un courant de fuite à un point de circuit connecté à une broche de signal d'un dispositif en cours de vérification. On compense le courant de fuite en connectant le point de circuit à une source de tension, à un premier niveau de potentiel, en fournissant du courant au point de circuit à partir d'un second niveau de potentiel et en mesurant le courant fourni au point de circuit à partir de la source de tension. On fait varier, de manière sélective, le second niveau de potentiel de manière à ramener le courant fourni, depuis la source de tension, sensiblement à zéro. On déconnecte ainsi le point de circuit de la source de tension.
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Designated States: JP, KR
European Patent Office (AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LU, MC, NL, PT, SE)
Publication Language: English (EN)
Filing Language: English (EN)
Also published as:
KR1020010020388EP0979413JP2001522461