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1. (WO1998030423) CONTOUR FOLLOWING TOOL AND METHOD
Latest bibliographic data on file with the International Bureau   

Pub. No.: WO/1998/030423 International Application No.: PCT/US1998/000268
Publication Date: 16.07.1998 International Filing Date: 08.01.1998
Chapter 2 Demand Filed: 10.08.1998
IPC:
B08B 1/00 (2006.01) ,B08B 3/04 (2006.01) ,B60S 3/04 (2006.01) ,G01B 5/207 (2006.01)
B PERFORMING OPERATIONS; TRANSPORTING
08
CLEANING
B
CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
1
Cleaning by methods involving the use of tools, brushes, or analogous members
B PERFORMING OPERATIONS; TRANSPORTING
08
CLEANING
B
CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
3
Cleaning by methods involving the use or presence of liquid or steam
04
Cleaning involving contact with liquid
B PERFORMING OPERATIONS; TRANSPORTING
60
VEHICLES IN GENERAL
S
SERVICING, CLEANING, REPAIRING, SUPPORTING, LIFTING, OR MANOEUVRING OF VEHICLES, NOT OTHERWISE PROVIDED FOR
3
Vehicle cleaning apparatus not integral with vehicles
04
for exteriors of land vehicles
G PHYSICS
01
MEASURING; TESTING
B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
5
Measuring arrangements characterised by the use of mechanical means
20
for measuring contours or curvatures
207
using a plurality of fixed, simultaneously operating transducers
Applicants:
JUSTIIN, Louis, K. [US/US]; US
Inventors:
JUSTIIN, Louis, K.; US
Agent:
HEINL, Kevin, J. ; Brooks & Kushman 22nd floor 1000 Town Center Southfield, MI 48075, US
Priority Data:
08/780,67208.01.1997US
Title (EN) CONTOUR FOLLOWING TOOL AND METHOD
(FR) OUTIL ET PROCEDE POUR SUIVRE UN CONTOUR
Abstract:
(EN) A contour following tool (14) for engaging the surface (46) of a workpiece (13) is disclosed. The tool has axially shiftable pins (32) that are biased toward a position in which they are fully extended from a housing. As the contoured surface (46) of the workpiece (13) is accommodated by allowing the pins (32) to shit back from their fully extended position against the biasing force. The pins may be biased by a fluid under pressure or by springs (62). The tool may be used with a wiping cloth (48) or end caps (70) that may apply a cleaning fluid that is applied either externally or internally through the tool through a bore (80) formed in one or more of the pins. An alternative embodiment is disclosed for gauging the contour of a surface. Another alternative embodiment is disclosed for an assembly tool (190). A clamping block (150) utilizing the invention is also disclosed. A method of cleaning a contoured workpiece is also disclosed.
(FR) Outil pour suivre un contour (14), permettant d'engager la surface (46) d'une pièce à travailler (13). L'outil a deux tiges à modulation axiale (32) maintenues dans une position entièrement étendue depuis un boîtier. On insère la surface à contour (46) de la pièce à travailler (13) en laissant les tiges (32) revenir de leur extension complète, contre la force qui les y maintient. Ce maintien peut résulter d'un fluide sous pression ou de ressorts (62). L'outil est utilisable avec un chiffon d'essuyage (48) ou des bouchons d'extrémité (70) par lesquels s'écoule un fluide de nettoyage susceptible d'être appliqué en externe ou en interne à travers l'outil, via un trou (80) formé dans une ou plusieurs tiges. Une variante est décrite, qui consiste à évaluer un contour de surface. Une autre variante est décrite pour un outil d'assemblage (190). Un bloc de serrage (150) faisant appel au contenu de l'invention est également décrit, ainsi qu'un procédé de nettoyage d'une pièce à travailler ayant un contour.
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Designated States: AL, AM, AT, AU, AZ, BA, BB, BG, BR, BY, CA, CH, CN, CU, CZ, DE, DK, EE, ES, FI, GB, GE, GH, GM, GW, HU, IL, IS, JP, KE, KG, KP, KR, KZ, LC, LK, LR, LS, LT, LU, LV, MD, MG, MK, MN, MW, MX, NO, NZ, PL, PT, RO, RU, SD, SE, SG, SI, SK, SL, TJ, TM, TR, TT, UA, UG, US, UZ, VN, YU, ZW
African Regional Intellectual Property Organization (ARIPO) (GH, GM, KE, LS, MW, SD, SZ, UG, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (EPO) (AT, BE, CH, DE, DK, ES, FI, FR, GB, GR, IE, IT, LU, MC, NL, PT, SE)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)