WIPO logo
Mobile | Deutsch | Español | Français | 日本語 | 한국어 | Português | Русский | 中文 | العربية |
PATENTSCOPE

Search International and National Patent Collections
World Intellectual Property Organization
Search
 
Browse
 
Translate
 
Options
 
News
 
Login
 
Help
 
Machine translation
1. (WO1997036145) METHOD AND APPARATUS FOR OPTICAL ALIGNMENT OF A MEASURING HEAD IN AN X-Y PLANE
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/1997/036145    International Application No.:    PCT/US1997/007048
Publication Date: 02.10.1997 International Filing Date: 19.03.1997
Chapter 2 Demand Filed:    16.10.1997    
IPC:
G01B 11/27 (2006.01), G01G 9/00 (2006.01)
Applicants: MEASUREX CORPORATION [US/US]; 1 Results Way, Cupertino, CA 95014 (US) (For All Designated States Except US).
CHASE, Lee [US/US]; (US) (For US Only).
GOSS, John [US/US]; (US) (For US Only).
ALGUARD, Mark [US/US]; (US) (For US Only).
AXELROD, Steve [US/US]; (US) (For US Only).
HERZLINGER, Peter [US/US]; (US) (For US Only).
ANDERSON, Len [US/US]; (US) (For US Only).
KING, Harriss [US/US]; (US) (For US Only)
Inventors: CHASE, Lee; (US).
GOSS, John; (US).
ALGUARD, Mark; (US).
AXELROD, Steve; (US).
HERZLINGER, Peter; (US).
ANDERSON, Len; (US).
KING, Harriss; (US)
Agent: KREBS, Robert, E.; Burns, Doane, Swecker & Mathis, L.L.P., P.O. Box 1404, Alexandria, VA 22313-1404 (US)
Priority Data:
08/620,952 25.03.1996 US
Title (EN) METHOD AND APPARATUS FOR OPTICAL ALIGNMENT OF A MEASURING HEAD IN AN X-Y PLANE
(FR) PROCEDE ET DISPOSITIF POUR ALIGNER OPTIQUEMENT UNE TETE DE MESURE DANS UN PLAN XY
Abstract: front page image
(EN)A two-dimensional position detector, in combination with dynamic z and/or flutter sensors, provides dynamic misalignment detection and correction of a measuring head, thereby allowing accurate determinations to be made of properties of a sheet material, such as basis weight.
(FR)Un détecteur de position bidimensionnel, associé à des capteurs z dynamiques et/ou de flottement, permet la détection et la correction dynamiques d'un défaut d'alignement d'une tête de mesure, ce qui permet de déterminer avec précision les propriétés, tel que le grammage, d'un matériau en feuilles.
Designated States: AL, AM, AT, AU, AZ, BA, BB, BG, BR, BY, CA, CH, CN, CU, CZ, DE, DK, EE, ES, FI, GB, GE, HU, IL, IS, JP, KE, KG, KP, KR, KZ, LC, LK, LR, LS, LT, LU, LV, MD, MG, MK, MN, MW, MX, NO, NZ, PL, PT, RO, RU, SD, SE, SG, SI, SK, TJ, TM, TR, TT, UA, UG, US, UZ, VN.
African Regional Intellectual Property Organization (GH, KE, LS, MW, SD, SZ, UG)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, CH, DE, DK, ES, FI, FR, GB, GR, IE, IT, LU, MC, NL, PT, SE)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)