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1. (WO1997019367) SCATTER FILTER FOR EMISSION TOMOGRAPHY
Latest bibliographic data on file with the International Bureau

Pub. No.: WO/1997/019367 International Application No.: PCT/US1996/018779
Publication Date: 29.05.1997 International Filing Date: 21.11.1996
Chapter 2 Demand Filed: 17.06.1997
IPC:
G01T 1/164 (2006.01)
G PHYSICS
01
MEASURING; TESTING
T
MEASUREMENT OF NUCLEAR OR X-RADIATION
1
Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
16
Measuring radiation intensity
161
Applications in the field of nuclear medicine, e.g. in vivo counting
164
Scintigraphy
Applicants:
PICKER INTERNATIONAL, INC. [US/US]; 595 Miner Road Cleveland, OH 44143, US
Inventors:
DIFILIPPO, Frank, P.; US
Agent:
KINDER, Gordon, D.; Renner, Otto, Boisselle & Sklar, P.L.L. 19th floor 1621 Euclid Avenue Cleveland, OH 44115, US
Priority Data:
60/007,51122.11.1995US
Title (EN) SCATTER FILTER FOR EMISSION TOMOGRAPHY
(FR) FILTRE DE DIFFUSION POUR TOMOGRAPHIE PAR EMISSION
Abstract:
(EN) A novel scatter filter for use in emission tomography which filters out deflected rays of energy due to Compton scattering which generally have a lower energy. The filter allows most of the undeflected rays to pass through. This is accomplished by providing a layer of material having a particular density and atomic number between the detector and the source. As a result, the resultant image generated is greatly improved in clarity and quality.
(FR) Un nouveau filtre de diffusion destiné à être utilisé en tomographie par émission filtre les rayons d'énergie déviés, du fait de la diffusion Compton, présentant généralement une énergie inférieure. Le filtre permet le passage de la plupart des rayons non-déviés. Pour ce faire, on dispose une couche de matière présentant une densité et un numéro atomique particulier, entre le détecteur et la source. On améliore ainsi la clarté et la qualité de l'image obtenue.
Designated States: CA, JP
European Patent Office (AT, BE, CH, DE, DK, ES, FI, FR, GB, GR, IE, IT, LU, MC, NL, PT, SE)
Publication Language: English (EN)
Filing Language: English (EN)
Also published as:
EP0877956JP2000500586