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Machine translation
1. (WO1997009630) A METHOD FOR DETERMINING THE RELATIVE POSITIONS OF A PLURALITY OF LAYERS OF A MULTILAYER CIRCUIT BOARD, A DEVICE SUITABLE FOR CARRYING OUT SUCH A METHOD AND ALSO A MEASURING PIN AND A CIRCUIT BOARD SUITABLE FOR BEING USED WITH SUCH A METHOD
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/1997/009630    International Application No.:    PCT/NL1996/000339
Publication Date: 13.03.1997 International Filing Date: 27.08.1996
Chapter 2 Demand Filed:    19.02.1997    
IPC:
H05K 1/02 (2006.01), H05K 3/00 (2006.01), H05K 3/46 (2006.01)
Applicants: UBBENS, Henricus, Dethmer, Ubbo [NL/NL]; (NL)
Inventors: UBBENS, Henricus, Dethmer, Ubbo; (NL)
Agent: VAN KAN, J., J., H.; Algemeen Octrooibureau, World Trade Center, P. Petersstraat 160, NL-5612 LV Eindhoven (NL)
Priority Data:
1001113 01.09.1995 NL
Title (EN) A METHOD FOR DETERMINING THE RELATIVE POSITIONS OF A PLURALITY OF LAYERS OF A MULTILAYER CIRCUIT BOARD, A DEVICE SUITABLE FOR CARRYING OUT SUCH A METHOD AND ALSO A MEASURING PIN AND A CIRCUIT BOARD SUITABLE FOR BEING USED WITH SUCH A METHOD
(FR) PROCEDE DE DETERMINATION DES POSITIONS RELATIVES DE PLUSIEURS COUCHES D'UNE CARTE A CIRCUIT IMPRIME MULTICOUCHE, DISPOSITIF PREVU A CET EFFET,TIGE DE MESURE ET CARTE IMPRIMEE A UTILISER AVEC CE PROCEDE
Abstract: front page image
(EN)A method for determining the relative positions of a plurality of layers of a multilayer circuit board, whereby each layer is provided with a number of marks. Reference holes are drilled through superimposed marks of several layers and the position of the mark of each layer relative to the reference hole is measured at each reference hole by means of a measuring pin on the basis of material transitions in said mark, after which the relative positions of the layers with respect to each other are calculated. The position of a mark is measured by means of a measuring pin provided with a sensor, whereby the sensor is rotated and translated in the reference hole by means of the measuring pin.
(FR)Procédé permettant de déterminer les positions relatives de plusieurs couches d'une carte à circuit imprimé multicouche, chaque couche présentant plusieurs repères. Des orifices de référence sont percés dans les repères superposés de plusieurs couches et la position du repère de chaque couche par rapport à l'orifice de référence est mesurée au niveau de chaque orifice de référence au moyen d'une tige de mesure, en fonction des transitions matière dans ledit repère, après quoi les positions relatives des couches les unes par rapport aux autres sont calculées. La position d'un repère est mesurée au moyen d'une tige de mesure dotée d'un capteur conçu pour décrire un mouvement de rotation et de translation dans l'orifice de référence, mouvement imprimé au moyen de la tige.
Designated States: AL, AM, AT, AU, AZ, BB, BG, BR, BY, CA, CH, CN, CU, CZ, DE, DK, EE, ES, FI, GB, GE, HU, IL, IS, JP, KE, KG, KP, KR, KZ, LK, LR, LS, LT, LU, LV, MD, MG, MK, MN, MW, MX, NO, NZ, PL, PT, RO, RU, SD, SE, SG, SI, SK, TJ, TM, TR, TT, UA, UG, US, UZ, VN.
African Regional Intellectual Property Organization (KE, LS, MW, SD, SZ, UG)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, CH, DE, DK, ES, FI, FR, GB, GR, IE, IT, LU, MC, NL, PT, SE)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: Dutch; Flemish (NL)