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1. WO1994002840 - SYSTEM FOR DETECTING ATOMIC OR MOLECULAR SPECTRA OF A SUBSTANCE, AND/OR THRESHOLD PHENOMENA ASSOCIATED WITH THE SAME

Publication Number WO/1994/002840
Publication Date 03.02.1994
International Application No. PCT/US1993/006718
International Filing Date 16.07.1993
Chapter 2 Demand Filed 16.02.1994
IPC
G01N 27/00 2006.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
27Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
G01Q 60/18 2010.01
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY
60Particular types of SPM or apparatus therefor; Essential components thereof
18SNOM or apparatus therefor, e.g. SNOM probes
G11B 11/00 2006.01
GPHYSICS
11INFORMATION STORAGE
BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
11Recording on, or reproducing from, the same record carrier wherein for these two operations the methods or means are covered by different main groups of groups G11B3/-G11B7/212; Record carriers therefor
G11B 11/08 2006.01
GPHYSICS
11INFORMATION STORAGE
BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
11Recording on, or reproducing from, the same record carrier wherein for these two operations the methods or means are covered by different main groups of groups G11B3/-G11B7/212; Record carriers therefor
08using recording by electric charge or by variation of electric resistance or capacitance
H01J 37/20 2006.01
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
37Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
02Details
20Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
CPC
G01Q 60/12
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
60Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
10STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes
12STS [Scanning Tunnelling Spectroscopy]
G11B 11/002
GPHYSICS
11INFORMATION STORAGE
BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
11Recording on or reproducing from the same record carrier wherein for these two operations the methods are covered by different main groups of groups G11B3/00 - G11B7/00 or by different subgroups of group G11B9/00; Record carriers therefor
002using recording by perturbation of the physical or electrical structure
G11B 11/08
GPHYSICS
11INFORMATION STORAGE
BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
11Recording on or reproducing from the same record carrier wherein for these two operations the methods are covered by different main groups of groups G11B3/00 - G11B7/00 or by different subgroups of group G11B9/00; Record carriers therefor
08using recording by electric charge or by variation of electric resistance or capacitance
H01J 2237/204
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
2237Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
20Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
204Means for introducing and/or outputting objects
H01J 2237/2065
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
2237Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
20Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
206Modifying objects while observing
2065Temperature variations
H01J 2237/2538
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
2237Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
25Tubes for localised analysis using electron or ion beams
2505characterised by their application
2538Low energy electron microscopy [LEEM]
Applicants
  • THE PENN STATE RESEARCH FOUNDATION [US]/[US] (AllExceptUS)
  • BIOTECHNOLOGY RESEARCH AND DEVELOPMENT CORPORATION [US]/[US] (AllExceptUS)
  • WEISS, Paul, S. [US]/[US] (UsOnly)
  • STRANICK, Stephan, J. [US]/[US] (UsOnly)
Inventors
  • WEISS, Paul, S.
  • STRANICK, Stephan, J.
Agents
  • HSUE, James, S.
Priority Data
07/916,16517.07.1992US
07/979,59720.11.1992US
08/056,34830.04.1993US
08/092,01615.07.1993US
08/092,13315.07.1993US
Publication Language English (EN)
Filing Language English (EN)
Designated States
Title
(EN) SYSTEM FOR DETECTING ATOMIC OR MOLECULAR SPECTRA OF A SUBSTANCE, AND/OR THRESHOLD PHENOMENA ASSOCIATED WITH THE SAME
(FR) SYSTEME DE DETECTION DU SPECTRE ATOMIQUE OU MOLECULAIRE ET/OU DES PHENOMENES DE SEUIL ASSOCIES
Abstract
(EN)
A microwave sweep oscillator or other signal source is used to apply a time varying signal to a scanning tunneling microscope and the current or voltage passing through a sample between the electrodes or the signal coupled by an electrode and reflected from the sample is measured by a microwave spectrum/network analyzer. The frequency of the signal applied by the oscillator may be swept across a spectrum and the optimum frequency of the spectrum is determined so that an improved image of the surface of a sample may be obtained. The spectrum of a known substance may also be recorded and used as a signature for identifying components of an unknown substance by comparison. When applied to electrochemical cells, dynamic information of the electrochemical cell can be measured. When applied to a Coulomb blockade device, charging thresholds and charge dissipation rates can be measured. Using multiple input frequencies, multiple substances may be monitored simultaneously. When applied to an array of Coulomb blockade devices used as a current standard, accuracy of the standard can be tested and the signal-to-noise ratio can be improved in the measurements, or the threshold of the devices can be detected.
(FR)
L'invention concerne un générateur hyperfréquence ou toute autre source de signaux utilisé pour appliquer un signal variant dans le temps à un microscope de balayage par effet tunnel, le courant ou la tension passant dans un échantillon entre les électrodes ou le signal couplé par une électrode et réfléchi par l'échantillon étant mesurés par un analyseur de réseau/spectre hyperfréquence. La fréquence du signal appliqué par le générateur peut être balayée sur un spectre et la fréquence optimale du spectre est déterminée de manière à obtenir une meilleure image de la surface d'un échantillon. Le spectre d'une substance connue peut également être enregistré et utilisé comme signature pour identifier par comparaison les composants d'une substance inconnue. Lorsque le signal est appliqué à des cellules électrochimiques, les informations dynamiques de celles-ci peuvent être mesurées. Lorsqu'il est appliqué à un dispositif de blocage de Coulomb, les seuils de charge et les taux de dissipation de charge peuvent être mesurés. Plusieurs sustances peuvent être contrôlées simultanément au moyen de multiples fréquences d'entrée. Lorsque le signal est appliqué à un groupement de dispositifs de blocage de Coulomb utilisés comme étalon, la précision de l'étalon peut être testée et le rapport signal/bruit peut être amélioré dans les mesures, ou le seuil des dispositifs peut être détecté.
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