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1. (WO1991006875) METHOD FOR RADIATION DETECTION AND MEASUREMENT
Latest bibliographic data on file with the International Bureau

Pub. No.: WO/1991/006875 International Application No.: PCT/US1990/006316
Publication Date: 16.05.1991 International Filing Date: 31.10.1990
Chapter 2 Demand Filed: 02.05.1991
IPC:
G01T 1/10 (2006.01) ,G01T 1/105 (2006.01)
G PHYSICS
01
MEASURING; TESTING
T
MEASUREMENT OF NUCLEAR OR X-RADIATION
1
Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
02
Dosimeters
10
Luminescent dosimeters
G PHYSICS
01
MEASURING; TESTING
T
MEASUREMENT OF NUCLEAR OR X-RADIATION
1
Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
02
Dosimeters
10
Luminescent dosimeters
105
Read-out devices
Applicants:
BATTELLE MEMORIAL INSTITUTE [US/US]; 902 Battelle Boulevard Richland, WA 99352, US
Inventors:
MILLER, Steven, D.; US
Agent:
MAY, Stephen, R.; Battelle Memorial Institute 902 Battelle Boulevard Richland, WA 99352, US
Priority Data:
431,30703.11.1989US
Title (EN) METHOD FOR RADIATION DETECTION AND MEASUREMENT
(FR) PROCEDE DE DETECTION ET DE MESURE DE RADIATIONS
Abstract:
(EN) M-center luminescence is used to measure radiation. An LiF crystal (20) is excited with a 442 nm He-Cd laser because absorption measurements in LiF indicate the peak of the M-center absorption occurs at 443 nm. Laser stimulation produces an excited state of the M-center, which undergoes a very strong Stokes' shift. The peak of the M-center emission spectrum occurs at 665 nm with a half-width of 0.36 ev. Since the excitation wavelength differs significantly from the emission wavelength, measurement of the deep red emission can be done simultaneously with the excitation. The population of M-centers grows with increasing radiation damage, and therefore M-center luminescence provides a basis for radiation dosimetry.
(FR) On utilise la luminescence des centres M afin de mesurer des radiations. On excite un crystal LiF (20) à l'aide d'un laser (442) nm He-Cd, car les mesures d'absorption dans LiF indiquent que la crête de l'absorption des centres M se produit à 443 nm. La stimulation laser produit un état excité du centre M, lequel subit un fort décalage de coup. La crête du spectre d'émission du centre M se produit à 665 nm avec une demi largeur de 0,36 ev. Puisque la longueur d'onde d'excitation diffère de manière significative de la longueur d'onde d'émission, on peut procéder simultanément à la mesure de l'émission rouge foncé et de l'excitation. La population de centres M croît avec l'augmentation des détériorations par radiations, et par conséquent la luminescence des centres M produit une base de dosimétrie de radiation.
Designated States: CA, JP, SU
European Patent Office (AT, BE, CH, DE, DK, ES, FR, GB, GR, IT, LU, NL, SE)
Publication Language: English (EN)
Filing Language: English (EN)
Also published as:
EP0499626CA2067814