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1. WO1990013039 - TESTING DEVICE FOR TESTING ELECTRICAL OR ELECTRONIC TEST SPECIMENS

Publication Number WO/1990/013039
Publication Date 01.11.1990
International Application No. PCT/EP1990/000668
International Filing Date 25.04.1990
Chapter 2 Demand Filed 25.05.1990
IPC
G01R 1/073 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types covered by groups G01R5/-G01R13/122
02General constructional details
06Measuring leads; Measuring probes
067Measuring probes
073Multiple probes
CPC
G01R 1/07307
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
02General constructional details
06Measuring leads; Measuring probes
067Measuring probes
073Multiple probes
07307with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
G01R 1/07357
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
02General constructional details
06Measuring leads; Measuring probes
067Measuring probes
073Multiple probes
07307with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
07357with flexible bodies, e.g. buckling beams
Applicants
  • ATG ELECTRONIC GMBH [DE]/[DE] (AllExceptUS)
  • ARNAUDOV, Konstantin [DE]/[DE] (UsOnly)
  • PROKOPP, Manfred [DE]/[DE] (UsOnly)
Inventors
  • ARNAUDOV, Konstantin
  • PROKOPP, Manfred
Agents
  • GLEISS, Alf-Olav
Priority Data
P 39 13 796.126.04.1989DE
Publication Language German (DE)
Filing Language German (DE)
Designated States
Title
(DE) PRÜFVORRICHTUNG ZUM PRÜFEN VON ELEKTRISCHEN ODER ELEKTRONISCHEN PRÜFLINGEN
(EN) TESTING DEVICE FOR TESTING ELECTRICAL OR ELECTRONIC TEST SPECIMENS
(FR) DISPOSITIF DE CONTROLE POUR CONTROLER DES ELEMENTS ELECTRIQUES OU ELECTRONIQUES
Abstract
(DE)
Prüfvorrichtung zum Prüfen von elektrischen oder elektronischen Prüflingen. Zur Prüfung eines Prüflings sind zwischen Tastpunkten der Prüfvorrichtung und ihnen gegenüberstehenden Prüfpunkten des Prüflings von dem Prüfschaltungssystem bewirkbare Prüfsignale übertragbar. Die Prüfvorrichtung weist mindestens eine auf Halbleiterbasis hergestellte Platte auf, an der zumindest einige Tastpunkte vorgesehen sind und/oder zumindest einige Kontaktnadeln zu ihrem elektrischen Anschluß angeordnet sind.
(EN)
To test a test specimen, test signals produced by the test circuit system can be transmitted between the measuring points of the testing device and opposing test points of the test specimen. The testing device has at least one board comprising a semiconductor, on which at least several measuring points are provided and/or at least several contact pins for their electrical connection are arranged.
(FR)
Pour contrôler un élément, on peut transmettre, entre des points de contact sur le dispositif de contrôle et des points de contrôle agencés sur l'élément et situés en face des premiers, des signaux de contrôle générés par le système de circuit de contrôle. Le dispositif de contrôle comporte au moins une plaquette comprenant un semiconducteur, sur laquelle se trouvent au moins quelques points de contact et/ou au moins quelques pointes de contact pour en assurer la connection électrique.
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