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Machine translation
1. (WO1986006476) SPECTROMETER WITH INTERFERENTIAL SELECTIVE AMPLITUDE MODULATION
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/1986/006476    International Application No.:    PCT/SU1985/000036
Publication Date: 06.11.1986 International Filing Date: 30.04.1985
IPC:
G01J 3/26 (2006.01)
Applicants: VSESOJUZNY NAUCHNO-ISSLEDOVATELSKY TSENTR PO IZUCH [SU/SU]; ENIJU SVOISTV POVERKHNOSTI I VAKUUMA (VNITsPV);, per. Ezdakov, 1;, Moscow, 117334 (SU).
LENINGRADSKY GOSUDARSTVENNY UNIVERSITET IMENI A.A. [SU/SU]; ZHDANOVA;, Universitetskaya naberezhnaya, 7/9;, Leningrad, 199164 (SU)
Inventors: IVANOV, Boris Iosifovich; (SU).
KIRICHENKO, Nikolai Andreevich; (SU).
KOZLOV, Nikolai Petrovich; (SU).
LOPATIN, Alexandr Iosifovich; (SU).
RAKHOVSKY, Vadim Izrailovich; (SU).
SHUKHTIN, Alexei Mikhailovich; (SU).
IOANNISIANI, Andronik Bagratovich; (SU)
Agent: THE USSR CHAMBER OF COMMERCE AND INDUSTRY; ul. Kuibysheva, 5/2, Moscow, 103012 (SU)
Priority Data:
Title (EN) SPECTROMETER WITH INTERFERENTIAL SELECTIVE AMPLITUDE MODULATION
(FR) SPECTROMETRE AVEC MODULATION D'AMPLITUDE INTERFERENTIELLE SELECTIVE
Abstract: front page image
(EN)A spectrometer with interferential selective amplitude modulation comprises, located consecutively along the light beam, a collimating means, a diffraction grating (7) and an additional mirror (10) oriented perpendicularly in relation to each other, two scanning mirrors (14, 15) on a common support (13) and a recording device (27), which comprises a means for compensation of the phase distortions. A plane-parallel plate (16) is placed between the scanning mirror (15) and the support (13), of which the thickness ''h'' corresponds to the following relationship: l <= h <= L, where l - the gap between the diffraction grating (7) and the additional mirror (10), L - the linear dimension of the diffraction grating (7).
(FR)Un spectromètre avec modulation d'amplitude interférentielle sélective comprend successivement le long du faisceau de lumière un collimateur, une grille de diffraction (7) et un miroir supplémentaire (10) orientés perpendiculairement les uns aux autres, deux miroirs de balayage (14, 15) placés sur un support commun (13) et un dispositif d'enregistrement (27) lequel comprend des moyens de compensation des distorsions de phase. Une plaque plan-parallèle (16) est placée entre le miroir de balayage (15) et le support (13) dont l'épaisseur ''h'' correspond à la relation suivante: l <= h <= L, où l représente l'intervalle entre la grille de diffraction (7) et le miroir supplémentaire (10), L représente la dimension linéaire de la grille de diffraction (7).
Designated States: AT, AU, CH, DE, GB, JP, SE.
Publication Language: Russian (RU)
Filing Language: Russian (RU)