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Machine translation
1. (WO1981000154) PROGRAMMABLE READ ONLY MEMORY INTEGRATED CIRCUIT WITH BITCHECK AND DEPROGRAMMING MODES AND METHODS FOR PROGRAMMING AND TESTING SAID CIRCUIT
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/1981/000154    International Application No.:    PCT/US1980/000828
Publication Date: 22.01.1981 International Filing Date: 01.07.1980
IPC:
G11C 16/34 (2006.01), G11C 29/34 (2006.01), G11C 29/50 (2006.01)
Applicants:
Inventors:
Priority Data:
53880 02.07.1979 US
Title (EN) PROGRAMMABLE READ ONLY MEMORY INTEGRATED CIRCUIT WITH BITCHECK AND DEPROGRAMMING MODES AND METHODS FOR PROGRAMMING AND TESTING SAID CIRCUIT
(FR) CIRCUIT INTEGRE A MEMOIRE MORTE PROGRAMMABLE AVEC DES MODES DE CONTROLE BINAIRE ET DE DEPROGRAMMATION ET METHODES DE PROGRAMMATION ET D'ESSAI DE CE CIRCUIT
Abstract: front page image
(EN)A programmable read only memory (PROM) integrated circuit is constructed with two new operating modes: a bit-check mode and a deprogramming mode. In the bitcheck mode, circuitry is provided to readily determine the apparent threshold voltage of each programmable transistor within the PROM. In the deprogramming mode, circuitry is provided to simultaneously subject all programmable transistors within the PROM to a deprogramming stress. The bitcheck mode provides a rapid programming method, and the bit-check mode and deprogramming mode are utilized in conjunction with each other to provide a rapid and thorough testing method.
(FR)Un circuit integre a memoire morte programmable (PROM) est construit avec deux nouveaux modes de fonctionnement: un mode a controle par bits et un mode de deprogrammation. Dans le mode de controle par bits, le reseau de circuit est concu pour determiner la tension de seuil apparente de chaque transistor programmable dans la (PROM). Dans le mode de deprogrammation, le reseau de circuit est concu pour soumettre simultanement tous les transistors programmables dans la (PROM) a une contrainte de deprogrammation. Le mode de controle par bits permet une programmation rapide, et le mode de controle par bits et le mode de deprogrammation sont utilises conjointement comme methode d'essai rapide et complet.
Designated States:
Publication Language: English (EN)
Filing Language: English (EN)