WIPO logo
Mobile | Deutsch | Español | Français | 日本語 | 한국어 | Português | Русский | 中文 | العربية |
PATENTSCOPE

Search International and National Patent Collections
World Intellectual Property Organization
Search
 
Browse
 
Translate
 
Options
 
News
 
Login
 
Help
 
Machine translation
1. (WO1980000614) CIRCUIT INTEGRITY TESTER
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/1980/000614    International Application No.:    PCT/US1979/000640
Publication Date: 03.04.1980 International Filing Date: 30.08.1979
IPC:
G01R 31/02 (2006.01), G01R 31/28 (2006.01)
Applicants:
Inventors:
Priority Data:
942099 13.09.1978 US
Title (EN) CIRCUIT INTEGRITY TESTER
(FR) APPAREIL D"ESSAI DE L"INTEGRITE DES CIRCUITS
Abstract: front page image
(EN)The test device is an electrolytic apparatus for the simultaneous non-destructive testing of the integrity of pluralities of circuit boards for continuity and anti-continuity or short circuits, including such circuit boards (23, 23a) as employ multi-layer or multi-level interconnection wiring, whether it be printed wiring or screen printed or thermally deposited circuits. Transient electro-deposition of one ion from an alkali halide water solution temporarily modifies the optical reflectivity of exposed circuit terminals (100) or metal parts of the circuit boards under test in a characteristic and easily recognized manner according to the continuity status of the associated circuit paths (104, 106).
(FR)L"appareil d"essai est un appareil electrolytique pour l"essai simultane non destructeur de l"integrite de plusieurs plaquettes de circuit pour controler leur continuite et leur anticontinuite ou court-circuit, de telles plaquettes de circuit (23, 23a) utilisant un cablage d"interconnexion a multi-couches ou multi-niveaux, que ce soit un cablage imprime ou des circuits imprimes sur ecran ou des circuits formes par depot thermique. Le depot electrolytique momentane d"un ion d"une solution aqueuse d"un halogenure alcalin modifie temporairement la reflectance optique des bornes (100) du circuit expose ou des parties metalliques des plaquettes de circuit a l"essai de maniere caracteristique et que l"on peut reconnaitre facilement selon l"etat de continuite des chemins du circuit associes (104, 106).
Designated States:
Publication Language: English (EN)
Filing Language: English (EN)