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1. US20130276176 - Atomic force microscope probe, method for preparing same, and uses thereof

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United States of America
Application Number 13997139
Application Date 20.12.2011
Publication Number 20130276176
Publication Date 17.10.2013
Grant Number 08959661
Grant Date 17.02.2015
Publication Kind B2
IPC
G01Q 60/24
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY
60Particular types of SPM or apparatus therefor; Essential components thereof
24AFM or apparatus therefor, e.g. AFM probes
G01Q 60/38
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY
60Particular types of SPM or apparatus therefor; Essential components thereof
24AFM or apparatus therefor, e.g. AFM probes
38Probes, their manufacture or their related instrumentation, e.g. holders
G01Q 10/04
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY
10Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
04Fine scanning or positioning
G01Q 20/04
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY
20Monitoring the movement or position of the probe
04Self-detecting probes, i.e. wherein the probe itself generates a signal representative of its position, e.g. piezo-electric gauge
G01Q 60/42
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY
60Particular types of SPM or apparatus therefor; Essential components thereof
24AFM or apparatus therefor, e.g. AFM probes
38Probes, their manufacture or their related instrumentation, e.g. holders
42Functionalisation
B82Y 35/00
BPERFORMING OPERATIONS; TRANSPORTING
82NANOTECHNOLOGY
YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE  OR TREATMENT OF NANOSTRUCTURES
35Methods or apparatus for measurement or analysis of nanostructures
CPC
G01Q 60/38
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
60Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
24AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
38Probes, their manufacture, or their related instrumentation, e.g. holders
B82Y 35/00
BPERFORMING OPERATIONS; TRANSPORTING
82NANOTECHNOLOGY
YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
35Methods or apparatus for measurement or analysis of nanostructures
G01Q 10/045
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
10Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
04Fine scanning or positioning
045Self-actuating probes, i.e. wherein the actuating means for driving are part of the probe itself, e.g. piezoelectric means on a cantilever probe
G01Q 20/04
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
20Monitoring the movement or position of the probe
04Self-detecting probes, i.e. wherein the probe itself generates a signal representative of its position, e.g. piezo-electric gauge
G01Q 60/42
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
60Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
24AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
38Probes, their manufacture, or their related instrumentation, e.g. holders
42Functionalisation
Applicants Polesel-Maris Jérôme
Commissariat à l'Énergie Atomique et aux Énergies Alternatives
Berthelot Thomas
Viel Pascal
Inventors Polesel-Maris Jérôme
Berthelot Thomas
Viel Pascal
Agents Knobbe, Martens, Olson & Bear, LLP
Priority Data 1061038 22.12.2010 FR
Title
(EN) Atomic force microscope probe, method for preparing same, and uses thereof
front page image
Abstract
(EN)

An atomic force microscope probe comprising a piezo-electric resonator provided with two electrodes and coated with an insulating layer and a tip attached on the coated resonator and functionalized with at least one group or molecule of interest is disclosed. The disclosed technology also relates to preparation method and to different uses thereof.
Related patent documents
FR2969762
EP2656085
WO/2012/084994
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