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1. US20120151638 - Method for measuring the force interaction that is caused by a sample

Office United States of America
Application Number 13390623
Application Date 27.08.2010
Publication Number 20120151638
Publication Date 14.06.2012
Grant Number 08832860
Grant Date 09.09.2014
Publication Kind B2
IPC
G01Q 60/10
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY
60Particular types of SPM or apparatus therefor; Essential components thereof
10STM or apparatus therefor, e.g. STM probes
CPC
G01Q 60/16
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
60Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
10STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes
16Probes, their manufacture, or their related instrumentation, e.g. holders
G01Q 30/12
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
30Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
08Means for establishing or regulating a desired environmental condition within a sample chamber
12Fluid environment
Applicants Temirov Ruslan
Forschungszentrum Juelich GmbH
Weiss Christian
Inventors Temirov Ruslan
Tautz Frank Stefan
Agents Jordan and Hamburg LLP
Title
(EN) Method for measuring the force interaction that is caused by a sample
Abstract
(EN)

Disclosed is a method for measuring the force interaction caused by a sample, wherein a bias voltage, with respect to the sample, is applied between a tip, and the tip is guided at such a small distance to the sample that a measurable current flows between the tip and the sample, and a sensor and signal converter S, which changes the current flowing through the tip-sample contact depending on the intensity of the force interaction, is formed and used in the region of the force interaction. A scanning tunneling microscope therefor is disclosed.