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1. US20100021067 - ABNORMAL AREA DETECTION APPARATUS AND ABNORMAL AREA DETECTION METHOD

Office United States of America
Application Number 12304552
Application Date 13.06.2007
Publication Number 20100021067
Publication Date 28.01.2010
Publication Kind A1
IPC
G06K 9/46
GPHYSICS
06COMPUTING; CALCULATING OR COUNTING
KRECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
9Methods or arrangements for reading or recognising printed or written characters or for recognising patterns, e.g. fingerprints
36Image preprocessing, i.e. processing the image information without deciding about the identity of the image
46Extraction of features or characteristics of the image
Applicants OTSU NOBUYUKI
NANRI TAKUYA
Inventors Otsu Nobuyuki
Nanri Takuya
Agents NIXON & VANDERHYE, PC
Priority Data 2006167961 16.06.2006 JP
Title
(EN) ABNORMAL AREA DETECTION APPARATUS AND ABNORMAL AREA DETECTION METHOD
Abstract
(EN)

An abnormal area detecting apparatus is provided for detecting the presence or absence and the position of abnormality with high accuracy using higher-order local auto-correlation feature. The abnormal area detecting apparatus comprises means for extracting feature data from image data on a pixel-by-pixel basis through higher-order local auto-correlation; means for adding the feature data extracted by the feature data extracting means for pixels within a predetermined range including each of pixels spaced apart by a predetermined distance; means for calculating an index indicative of abnormality of feature data with respect to a subspace indicative of a normal area; means for determining an abnormality based on the index; and means for outputting a pixel position at which an abnormal is determined. The apparatus may extract a plurality of higher-order local auto-correlation feature data which differ in displacement width. Further, the apparatus may comprise means for finding a subspace indicative of a normal area based on a principal component vector from feature data in accordance with a principal component analysis approach. The apparatus is capable of determine an abnormality on a pixel-by-pixel basis, and capable of correctly detecting the position of an abnormal area.

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