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1. US6894276 - Probing method using ion trap mass spectrometer and probing device

Office
United States of America
Application Number 10311270
Application Date 13.12.2002
Publication Number 6894276
Publication Date 17.05.2005
Grant Number 6894276
Grant Date 17.05.2005
Publication Kind B1
IPC
H01J 49/42
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
49Particle spectrometers or separator tubes
26Mass spectrometers or separator tubes
34Dynamic spectrometers
42Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
CPC
H01J 49/0031
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
49Particle spectrometers or separator tubes
0027Methods for using particle spectrometers
0031Step by step routines describing the use of the apparatus
G01N 33/0057
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
33Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
0004Gaseous mixtures, e.g. polluted air
0009General constructional details of gas analysers, e.g. portable test equipment
0027concerning the detector
0036Specially adapted to detect a particular component
0057for warfare agents or explosives
H01J 49/004
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
49Particle spectrometers or separator tubes
004Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
H01J 49/424
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
49Particle spectrometers or separator tubes
26Mass spectrometers or separator tubes
34Dynamic spectrometers
42Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
4205Device types
424Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes
Applicants Hitachi, Ltd.
Inventors Takada Yasuaki
Sakairi Minoru
Agents Antonelli, Terry, Stout & Kraus, LLP
Priority Data JP00006411 20.09.2000 WO
Title
(EN) Probing method using ion trap mass spectrometer and probing device
Abstract
(EN)

In a detecting device based on mass spectrometry, fast screening is conducted by using a step (201) of acquiring a mass spectrum and a step (202) of deciding if ions of an intrinsic m/z are present. In accordance with the decision results from the decision step (202), a step (203) of conducting tandem mass spectrometry is switched to so as to make detailed checking. A step (204) of deciding if ions of peculiar m/z are present is executed on the basis of the results obtained by the tandem mass spectrometry. An alarm is issued according to the decision result step (205). Thus, fast and less-misreporting detecting can be performed.