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1. US5926027 - Apparatus and method for testing a device

Office
United States of America
Application Number 08995734
Application Date 22.12.1997
Publication Number 5926027
Publication Date 20.07.1999
Grant Number 5926027
Grant Date 20.07.1999
Publication Kind A
IPC
G01R 31/26
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
26Testing of individual semiconductor devices
G01R 1/02
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types covered by groups G01R5/-G01R13/122
02General constructional details
G01R 1/04
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types covered by groups G01R5/-G01R13/122
02General constructional details
04Housings; Supporting members; Arrangements of terminals
G01R 31/28
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
CPC
G01R 31/2886
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
2851Testing of integrated circuits [IC]
2886Features relating to contacting the IC under test, e.g. probe heads; chucks
G01R 1/0433
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
02General constructional details
04Housings; Supporting members; Arrangements of terminals
0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
0433Sockets for IC's or transistors
Applicants BUMB, JR.; FRANK E.
GATES; GEOFFREY W.
GOOD; DAVID C.
Inventors Bumb Frank E.
Gates Geoffrey W.
Good David C.
Agents Parsons & Goltry
Goltry Michael W.
Parsons Robert A.
Priority Data 08535488 28.09.1995 US
Title
(EN) Apparatus and method for testing a device
Abstract
(EN)

An apparatus for testing a device including a plurality of elements each having contact surface and a non-contact surface, the apparatus comprising a base for holding the device, the base having a contact surface engageable with the contact surface of each element, an actuator, a plurality of compliant members carried by the actuator to engage the non-contact surface of each element, each compliant member further including an aspect ratio of at least 1:1, and means for exerting a force against the actuator, the aspect ratio for allowing the compliant members to compensate for physical variations of the elements, provide compliance between the apparatus and the elements and substantial coplanarity between the contact surface of each element and the contact surface of the base while allowing a sufficient focusing of force by the compliant members against the non-contact surface of each element to provide contact between the contact surface of each element and the contact surface of the base without damaging the elements.


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