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1. US20220034831 - METHOD OF DIAGNOSING THE LIFETIME OF STRUCTURES AND SYSTEM FOR DIAGNOSING THE SAME

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Office
United States of America
Application Number 17178399
Application Date 18.02.2021
Publication Number 20220034831
Publication Date 03.02.2022
Publication Kind A1
IPC
G01N 25/20
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
25Investigating or analysing materials by the use of thermal means
20by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity
G01N 27/04
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
27Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
02by investigating impedance
04by investigating resistance
CPC
G01N 27/041
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
27Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
02by investigating impedance
04by investigating resistance
041of a solid body
G01N 25/20
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
25Investigating or analyzing materials by the use of thermal means
20by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity
Applicants MACTEC Corp.
Inventors Young Suk Kim
Sung Soo Kim
Priority Data 1020200095746 31.07.2020 KR
Title
(EN) METHOD OF DIAGNOSING THE LIFETIME OF STRUCTURES AND SYSTEM FOR DIAGNOSING THE SAME
front page image
Abstract
(EN)

The present invention relates to a method of diagnosing the lifetime of a structure and a system for diagnosing the same, the method comprises a step for preparing a structure to be measured; a step for measuring an amount of exothermic or endothermic heat of the structure; a step for measuring an amount of entropy decrease of the structure by using the measured amount of exothermic or endothermic heat; and a step for diagnosing the remaining lifetime of the structure from the measured amount of entropy decrease.
Related patent documents
KR102241620
EP3945316
CN114062421
WO/2022/025618
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