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1. US20180040464 - Systems and methods for relay ionization

Office United States of America
Application Number 15556401
Application Date 09.03.2016
Publication Number 20180040464
Publication Date 08.02.2018
Grant Number 10242856
Grant Date 26.03.2019
Publication Kind B2
IPC
H01J 49/00
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
49Particle spectrometers or separator tubes
H01J 49/04
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
49Particle spectrometers or separator tubes
02Details
04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
H01J 49/16
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
49Particle spectrometers or separator tubes
02Details
10Ion sources; Ion guns
16using surface ionisation, e.g. field-, thermionic- or photo-emission
CPC
H01J 49/00
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
49Particle spectrometers or separator tubes
H01J 49/04
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
49Particle spectrometers or separator tubes
02Details
04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
H01J 49/0409
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
49Particle spectrometers or separator tubes
02Details
04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
0409Sample holders or containers
H01J 49/165
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
49Particle spectrometers or separator tubes
02Details
10Ion sources; Ion guns
16using surface ionisation, e.g. field-, thermionic- or photo-emission
165Electrospray ionisation
H01J 49/167
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
49Particle spectrometers or separator tubes
02Details
10Ion sources; Ion guns
16using surface ionisation, e.g. field-, thermionic- or photo-emission
165Electrospray ionisation
167Capillaries and nozzles specially adapted therefor;
Applicants Purdue Research Foundation
Inventors Robert Graham Cooks
Anyin Li
Adam Hollerbach
Agents Brown Rudnick LLP
Adam M. Schoen
Title
(EN) Systems and methods for relay ionization
Abstract
(EN)

The invention generally relates to systems and methods for relay ionization of a sample. In certain aspects, the invention provides systems that include an ion source that generates ions, a sample emitter configured to hold a sample, and a mass spectrometer. The system is configured such that the ions generated by the ion source are directed to interact with the sample emitter, thereby causing the sample to be discharged from the sample emitter and into the mass spectrometer.

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