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1. KR1020180090134 - TEST PROBE AND TEST SOCKET

Office
Republic of Korea
Application Number 1020170015153
Application Date 02.02.2017
Publication Number 1020180090134
Publication Date 10.08.2018
Grant Number 1019208240000
Grant Date 21.11.2018
Publication Kind B1
IPC
G01R 1/067
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types covered by groups G01R5/-G01R13/122
02General constructional details
06Measuring leads; Measuring probes
067Measuring probes
G01R 31/28
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
Applicants LEENO IND. INC.
리노공업주식회사
Inventors BAEK, SEUNG HA
백승하
Agents 허성원
이동욱
서동헌
Title
(EN) TEST PROBE AND TEST SOCKET
(KO) 검사용 프로브 및 소켓
Abstract
(EN) Disclosed is a test probe of an object to be tested having a contact terminal to be tested of a curved surface cylindrical shape. The test probe comprises a first contact member having a contact part which has a pair of contact surfaces arranged in a V-shape so as to be individually in contact with a separated position of the contact terminal to be tested and an extension part which integrally and backwardly extends along the longitudinal direction from the contact part. According to the present invention, the test probe can prevent a test error by effectively contacting with the contact terminal to be tested of the partial curved surface cylindrical shape of the object to be tested such as an ultra-small camera module for a smart phone. COPYRIGHT KIPO 2018
(KO) 곡면 통형상의 피검사접촉단자를 갖는 피검사체의 검사용 프로브가 개시된다. 검사용 프로브는 V형으로 배치되어 상기 피검사접촉단자의 상호 이격된 위치에 각각 접촉하는 한 쌍의 접촉면을 가진 접촉부와, 상기 접촉부로부터 길이방향을 따라 후방으로 일체 연장하는 연장부를 갖는 제1접촉부재를 포함한다. 본 발명의 검사용프로브에 의하면, 스마트폰용 초소형 카메라모듈과 같은 피검사체의 부분 곡면 통형상의 피검사접촉단자에 효과적으로 접촉하여 검사에러를 방지할 수 있다.
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