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1. JPWO2018135384 - 自動分析装置

Office
Japan
Application Number 2018563296
Application Date 12.01.2018
Publication Number WO2018135384
Publication Date 26.07.2018
Publication Kind A5
IPC
G01N 35/02
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
35Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/-G01N33/148; Handling materials therefor
02using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
CPC
G01N 21/11
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
01Arrangements or apparatus for facilitating the optical investigation
11Filling or emptying of cuvettes
G01N 21/253
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
17Systems in which incident light is modified in accordance with the properties of the material investigated
25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
251Colorimeters; Construction thereof
253for batch operation, i.e. multisample apparatus
G01N 21/274
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
17Systems in which incident light is modified in accordance with the properties of the material investigated
25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
27using photo-electric detection
274Calibration, base line adjustment, drift correction
G01N 35/0092
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
35Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
00584Control arrangements for automatic analysers
0092Scheduling
G01N 35/025
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
35Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
02using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
025having a carousel or turntable for reaction cells or cuvettes
G01N 35/04
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
35Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
02using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
04Details of the conveyor system
Applicants 株式会社日立ハイテク
Inventors 中沢 隆史
川原 鉄士
西田 正治
井上 陽子
八木 賢一
松本 修
朝田 沙耶佳
Agents ポレール特許業務法人
Priority Data 2017009086 23.01.2017 JP
Title
(JA) 自動分析装置
Abstract
(JA)

オペレーターが反応容器のメンテナンスのために装置の分析を止めず、分析を行いながら必要なメンテナンスを自動で実行する自動分析装置を提供する。吸光度データの信頼性を確保するために、反応容器を清潔に保つためのメンテナンスが必須であるが、メンテナンスには30 分以上の時間を要し作業時間の増大が課題であった。複数日で反応ディスクに載置されたすべての反応容器が洗浄対象となるように日単位で洗浄対象の反応容器を記憶する記憶部を備え、制御部は、分析対象となる試料が該反応容器に分注された後のオペレーション状態中に、反応容器の夫々に分析対象となる試料を分析し、且つ、記憶部に記憶された当日の洗浄対象の反応容器に対し試料を分注せずに洗剤を分注し一定時間漬け置き洗浄するように制御する。また、装置の分析処理能力が低下する時間の許容幅に応じて、1 日当たりに洗浄する反応容器の数を可変にし、多様な施設に対応できるようにする。