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1. JP2012002661 - APPEARANCE INSPECTION DEVICE

Office
Japan
Application Number 2010137714
Application Date 16.06.2010
Publication Number 2012002661
Publication Date 05.01.2012
Publication Kind A
IPC
G01N 21/956
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
84Systems specially adapted for particular applications
88Investigating the presence of flaws, defects or contamination
95characterised by the material or shape of the object to be examined
956Inspecting patterns on the surface of objects
G06T 1/00
GPHYSICS
06COMPUTING; CALCULATING OR COUNTING
TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
1General purpose image data processing
H05K 13/08
HELECTRICITY
05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
13Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
08Monitoring manufacture of assemblages
CPC
G01N 21/94
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
84Systems specially adapted for particular applications
88Investigating the presence of flaws or contamination
94Investigating contamination, e.g. dust
G01N 21/95684
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
84Systems specially adapted for particular applications
88Investigating the presence of flaws or contamination
95characterised by the material or shape of the object to be examined
956Inspecting patterns on the surface of objects
95684Patterns showing highly reflecting parts, e.g. metallic elements
G01N 2021/95638
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
84Systems specially adapted for particular applications
88Investigating the presence of flaws or contamination
95characterised by the material or shape of the object to be examined
956Inspecting patterns on the surface of objects
95638for PCB's
Applicants 株式会社愛央技研
Inventors 松崎 智彦
Agents 特許業務法人ぱてな
Title
(EN) APPEARANCE INSPECTION DEVICE
(JA) 外観検査装置
Abstract
(EN)

PROBLEM TO BE SOLVED: To provide an appearance inspection device which can accurately inspect an appearance of an inspection object and allows reduction of production cost.

SOLUTION: The appearance inspection device includes: a liquid crystal color monitor 15 capable of irradiating a mounting substrate 7 including plural kinds of components with light; and a digital camera 17 for obtaining photographic information by photographing the mounting substrate 7. The appearance inspection device is further provided with a half mirror 19 between the liquid crystal color monitor 15 and mounting substrate 7, and with a full mirror 18 between the half mirror 19 and digital camera 17. The liquid crystal color monitor 15 is provided at a position so that the mounting substrate 7 can be irradiated with light transmitted through the half mirror 19. The digital camera 17 is provided at a position so that an image of the mounting substrate 7 reflected by the half mirror 19 via the reflection of the full mirror 18 can be photographed.

COPYRIGHT: (C)2012,JPO&INPIT


(JA)

【課題】検査対象の外観を正確に検査可能であるとともに、製造コストの低廉化が可能な外観検査装置を提供する。
【解決手段】本発明の外観検査装置は、複数種類の構成物からなる実装基板7に光を照射可能な液晶カラーモニタ15と、実装基板7を撮影して撮影情報を得るデジタルカメラ17とを備えている。また、この外観検査装置では、液晶カラーモニタ15と実装基板7との間にハーフミラー19が設けられており、ハーフミラー19とデジタルカメラ17との間にはフルミラー18が設けられている。この外観検査装置では、液晶カラーモニタ15はハーフミラー19を透過する光により実装基板7を照射可能な位置に設けられており、デジタルカメラ17は、フルミラー18の反射を介し、ハーフミラー19に反射した実装基板7の画像を撮影可能な位置に設けられている。
【選択図】図3


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