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1. FR2969762 - SONDE DE MICROSCOPE A FORCE ATOMIQUE, SON PROCEDE DE PREPARATION ET SES UTILISATIONS

Office
France
Application Number 1061038
Application Date 22.12.2010
Publication Number 2969762
Publication Date 29.06.2012
Grant Number 2969762
Grant Date 08.02.2013
Publication Kind B1
IPC
G01Q 20/04
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY
20Monitoring the movement or position of the probe
04Self-detecting probes, i.e. wherein the probe itself generates a signal representative of its position, e.g. piezo-electric gauge
G01Q 60/42
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY
60Particular types of SPM or apparatus therefor; Essential components thereof
24AFM or apparatus therefor, e.g. AFM probes
38Probes, their manufacture or their related instrumentation, e.g. holders
42Functionalisation
CPC
G01Q 10/045
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
10Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
04Fine scanning or positioning
045Self-actuating probes, i.e. wherein the actuating means for driving are part of the probe itself, e.g. piezoelectric means on a cantilever probe
G01Q 20/04
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
20Monitoring the movement or position of the probe
04Self-detecting probes, i.e. wherein the probe itself generates a signal representative of its position, e.g. piezo-electric gauge
G01Q 60/42
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
60Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
24AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
38Probes, their manufacture, or their related instrumentation, e.g. holders
42Functionalisation
B82Y 35/00
BPERFORMING OPERATIONS; TRANSPORTING
82NANOTECHNOLOGY
YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
35Methods or apparatus for measurement or analysis of nanostructures
G01Q 60/38
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
60Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
24AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
38Probes, their manufacture, or their related instrumentation, e.g. holders
Applicants COMMISSARIAT ENERGIE ATOMIQUE
Inventors POLESEL-MARIS JEROME
BERTHELOT THOMAS
VIEL PASCAL
Priority Data 1061038 22.12.2010 FR
Title
(FR) SONDE DE MICROSCOPE A FORCE ATOMIQUE, SON PROCEDE DE PREPARATION ET SES UTILISATIONS
Abstract
(FR) La présente invention concerne une sonde de microscope à force atomique comprenant (i) un résonateur piézo-électrique muni de deux électrodes et revêtu d'une couche isolante et (ii) une pointe fixée sur ledit résonateur revêtu et fonctionnalisée par au moins un groupement ou une molécule d'intérêt. La présente invention concerne également son procédé de préparation et ses différentes utilisations.
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