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1. EP1319945 - PROBING METHOD USING ION TRAP MASS SPECTROMETER AND PROBING DEVICE

Office
European Patent Office
Application Number 00961110
Application Date 20.09.2000
Publication Number 1319945
Publication Date 18.06.2003
Publication Kind A4
IPC
B01D 59/44
BPERFORMING OPERATIONS; TRANSPORTING
01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
DSEPARATION
59Separation of different isotopes of the same chemical element
44Separation by mass spectrography
H01J 49/42
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
49Particle spectrometers or separator tubes
26Mass spectrometers or separator tubes
34Dynamic spectrometers
42Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
CPC
G01N 33/0057
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
33Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
0004Gaseous mixtures, e.g. polluted air
0009General constructional details of gas analysers, e.g. portable test equipment
0027concerning the detector
0036Specially adapted to detect a particular component
0057for warfare agents or explosives
H01J 49/0031
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
49Particle spectrometers or separator tubes
0027Methods for using particle spectrometers
0031Step by step routines describing the use of the apparatus
H01J 49/004
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
49Particle spectrometers or separator tubes
004Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
H01J 49/424
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
49Particle spectrometers or separator tubes
26Mass spectrometers or separator tubes
34Dynamic spectrometers
42Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
4205Device types
424Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes
Applicants HITACHI LTD
Inventors TAKADA YASUAKI
SAKAIRI MINORU
Designated States
Priority Data 0006411 20.09.2000 JP
Title
(DE) SONDIERUNGSVERFAHREN MIT IONENFALLEN-MASSENSPEKTROMETER UND SONDIERUNGSEINRICHTUNG
(EN) PROBING METHOD USING ION TRAP MASS SPECTROMETER AND PROBING DEVICE
(FR) PROCEDE DE SONDAGE FAISANT INTERVENIR UN SPECTROMETRE DE MASSE A PIEGE IONIQUE ET DISPOSITIF DE SONDAGE
Abstract
(EN)
In a detecting device based on mass spectrometry, fast screening is conducted by using a step (201) of acquiring a mass spectrum and a step (202) of deciding if ions of an intrinsic m/z are present. In accordance with the decision results from the decision step (202), a step (203) of conducting tandem mass spectrometry is switched to so as to make detailed checking. A step (204) of deciding if ions of peculiar m/z are present is executed on the basis of the results obtained by the tandem mass spectrometry. An alarm is issued according to the decision result step (205). Thus, fast and less-misreporting detecting can be performed.

(FR)
L'invention concerne un dispositif de sondage basé sur la spectrométrie de masse. Un criblage rapide est effectué au moyen d'une étape (201) consistant à acquérir un spectre de masse et d'une étape (202) consistant à déterminer si un ion à m/z intrinsèque existe ou non. A des fins de vérification, on passe à une étape (203) qui consiste à réaliser une spectrométrie de masse en tandem en fonction du résultat de l'étape (202). Un avertissement est déclenché (205) à partir du résultat obtenu dans la spectrométrie de masse en tandem via une étape (204) consistant à déterminer si un ion à m/z intrinsèque existe ou non et en fonction du résultat de la détermination. On peut ainsi effectuer un sondage rapide et sensiblement dépourvu d'erreur.