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1. EP1034449 - TEMPERATURE CONTROL FOR MICROSCOPY

Office
European Patent Office
Application Number 97950897
Application Date 25.11.1997
Publication Number 1034449
Publication Date 13.09.2000
Publication Kind B1
IPC
G01B 7/34
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
7Measuring arrangements characterised by the use of electric or magnetic means
34for measuring roughness or irregularity of surfaces
G01Q 30/10
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY
30Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
08Means for establishing or regulating a desired environmental condition within a sample chamber
10Thermal environment
G02B 21/28
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21Microscopes
24Base structure
28with cooling device
G02B 21/30
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21Microscopes
24Base structure
30with heating device
G05D 23/00
GPHYSICS
05CONTROLLING; REGULATING
DSYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
23Control of temperature
G05D 23/22
GPHYSICS
05CONTROLLING; REGULATING
DSYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
23Control of temperature
19characterised by the use of electric means
20with sensing elements having variation of electric or magnetic properties with change of temperature
22the sensing element being a thermocouple
CPC
G01Q 30/10
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
30Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
08Means for establishing or regulating a desired environmental condition within a sample chamber
10Thermal environment
G02B 21/28
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21Microscopes
24Base structure
28with cooling device
G02B 21/30
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21Microscopes
24Base structure
30with heating device
G05D 23/1919
GPHYSICS
05CONTROLLING; REGULATING
DSYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
23Control of temperature
19characterised by the use of electric means
1919characterised by the type of controller
G05D 23/22
GPHYSICS
05CONTROLLING; REGULATING
DSYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
23Control of temperature
19characterised by the use of electric means
20with sensing elements having variation of electric or magnetic properties with change of temperature
22the sensing element being a thermocouple
Applicants GOODYEAR TIRE & RUBBER
Inventors ARNOLD WILLIAM ALLEN
MARTENY PERRY
MARCELLI ANGELA MARIE
Designated States
Priority Data 9722513 25.11.1997 US
Title
(DE) TEMPERATURKONTROLLE FÜR DIE MIKROSKOPIE
(EN) TEMPERATURE CONTROL FOR MICROSCOPY
(FR) REGULATION DE TEMPERATURE POUR METHODE D'OBSERVATION AU MICROSCOPE
Abstract
(EN) A temperature control unit provides means for observing samples under microscopy at greatly elevated and greatly reduced temperatures. The temperature control unit is constructed to insulate a sample from ambient temperatures while providing a highly heat conductive substrate for the sample that provides for rapid heat transfer to/from the sample. A dry gas provides a positive pressure around the sample, as compared to atmospheric pressure to help prevent atmospheric contract with the sample.
(FR) L'invention se rapporte à une unité de régulation de la température qui permet une observation microscopique d'échantillons à des températures considérablement élevées ou considérablement basses. Ladite unité de régulation de la température est conçue pour isoler un échantillon de la température ambiante tout en fournissant à l'échantillon un support fortement conducteur de la chaleur qui assure un échange thermique rapide avec l'échantillon. Un gaz sec génère autour de l'échantillon une pression positive, comparée à la pression atmosphérique, qui permet d'empêcher le contact de l'échantillon avec l'environnement atmosphérique.