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133. (EP0405802) Electrooptic apparatus for the measurement of ultrashort electrical signals.

Application Number: 90306550 Application Date: 15.06.1990
Publication Number: 0405802 Publication Date: 02.01.1991
Publication Kind : B1
IPC:
G 01R
G 01R
G01R 15/00
G 01R
G01R 1/07
G 01R
G01R 15/24
G01R 29/02
G01R 31/308
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
13
Arrangements for displaying electric variables or waveforms
20
Cathode-ray oscilloscopes
22
Circuits therefor
34
Circuits for representing a single waveform by sampling, e.g. for very high frequencies
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
29
Arrangements for measuring or indicating electric quantities not covered by groups G01R19/-G01R27/135
02
Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
15
Details of measuring arrangements of the types provided for in groups G01R17/-G01R29/, G01R33/-G01R33/26176
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
15
Details of measuring arrangements of the types provided for in groups G01R17/-G01R29/, G01R33/-G01R33/26176
14
Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
24
using light-modulating devices
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1
Details of instruments or arrangements of the types covered by groups G01R5/-G01R13/122
02
General constructional details
06
Measuring leads; Measuring probes
067
Measuring probes
07
Non contact-making probes
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28
Testing of electronic circuits, e.g. by signal tracer
302
Contactless testing
308
using non-ionising electromagnetic radiation, e.g. optical radiation
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
15
Details of measuring arrangements of the types provided for in groups G01R17/-G01R29/, G01R33/-G01R33/26176
14
Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
24
using light-modulating devices
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
29
Arrangements for measuring or indicating electric quantities not covered by groups G01R19/-G01R27/135
02
Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28
Testing of electronic circuits, e.g. by signal tracer
302
Contactless testing
308
using non-ionising electromagnetic radiation, e.g. optical radiation
CPC:
G01R 31/308
G01R 1/071
G01R 15/241
G01R 29/02
Applicants: AT & T CORP
Inventors: KNOX WAYNE H
MILLER DAVID A B
Priority Data: 07371475 26.06.1989 US
Title: (DE) Elektrooptischer Apparat zum Messen von ultrakurzen elektrischen Signalen.
(EN) Electrooptic apparatus for the measurement of ultrashort electrical signals.
(FR) Appareil électro-optique pour la mesure de signaux électriques ultra-courts.
Abstract: front page image
(EN) An electrooptic measuring apparatus having both high voltage sensitivity and femtosecond time resolution comprises coplanar transmission lines fabricated on a semi-insulating multiple quantum well structure. An electrical signal, such as from a high speed electronic device, injected onto the transmission lines creates an electrical field parallel to the layer planes of the multiple quantum well structure. Excitonic electroabsorption by the multiple quantum well structure, in response to the parallel field, changes the transmissivity of the multiple quantum well structure. An external light beam directed through the multiple quantum well structure is modulated by the changes in transmissivity. By detecting this modulation, a sampling of the electrical signal is achieved.
Also published as:
DE000069022136