(EN) A device for measuring surface (2) comprises a light source (3), a light guiding device (4-6), a detector system (10) and an evaluation circuit (15). The light source (3) generates a sequence of light pulses having a repetition rate. The light guiding device (4-6) can be controlled to guide the sequence of light pulses onto a surface area (25) of the surface (2). The surface area can be selected from a plurality of surface areas (25, 27). The detector system is adapted to receive at least one light signal (21-24) which is scattered and/or reflected by the surface area (25). The evaluation circuit (15) is coupled to the detector system (10) and is adapted to determine a phase difference between the reference signal (19) derived from the sequence of light pulses and a signal component of the at least one light signal (21-24) to determine a position of the surface area (25).; The phase difference is determined for the signal component having a frequency that corresponds to a multiple of the repetition rate.
(ZH)
一种用于测量表面(2)的设备包括光源(3)、光引导装置(4-6)、检测器系统(10)和分析电路(15)。光源(3)产生具有重复率的光脉冲序列。光引导装置(4-6)可被控制以将光脉冲序列引导至表面(2)的表面区域(25)上。所述表面区域可从多个表面区域(25、28)中被选定。检测器系统适于接收被表面区域(25)散射和/或反射的至少一个光信号(21-24)。分析电路(15)被耦连至检测器系统(10)且适于确定由光脉冲序列得出的参考信号(19)和所述至少一个光信号(21-24)的信号分量之间的相位差，以确定表面区域(25)的位置。所述相位差是为频率对应于重复率的倍数的信号分量确定的。
