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1. (CN101233415) Integrated circuit test socket

Office : China
Application Number: 200680027635.4 Application Date: 07.07.2006
Publication Number: 101233415 Publication Date: 30.07.2008
Grant Number: 101233415 Grant Date: 28.09.2011
Publication Kind : B
Prior PCT appl.: Application Number:PCTUS2006026668 ; Publication Number:2007008754 Click to see the data
IPC:
G01R 1/04
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1
Details of instruments or arrangements of the types covered by groups G01R5/-G01R13/122
02
General constructional details
04
Housings; Supporting members; Arrangements of terminals
CPC:
G01R 1/0433
G01R 1/0466
H01R 12/88
H01R2201/20
Applicants: Spansion LLC
斯班逊有限公司
Inventors: Mingviriya Somboon
S·明威立耶
Agents: gebo
北京戈程知识产权代理有限公司 11314
Priority Data: 11180943 12.07.2005 US
Title: (EN) Integrated circuit test socket
(ZH) 集成电路测试座
Abstract: front page image
(EN) A test socket is provided for use in testing integrated circuits, especially integrated circuits in BGA packages. The test socket comprises a base member and a cover member configured to move vertically between an upper position and a lower position with respect to the base member. Springs are positioned between the base member and the cover member and configured to bias the cover member in the upper position. A lever is coupled to the base member and to the cover member and is configured to pivot to an open position when the cover member is in the lower position and to pivot to a closed position to confine an integrated circuit within the base member when the cover member is in the upper position.
(ZH)

本发明提供一种测试座以供测试集成电路使用,特别是球栅数组(BGA,Ball Grid Array)封装件中的集成电路。该测试座包括基座构件(base member),及配置成在相对于该基座构件的较高位置与较低位置之间垂直地移动的外盖构件(cover member)。在该基座构件与该外盖构件之间设有弹簧,且该弹簧配置成施加偏压(bias)于在该较高位置的该外盖构件。耦合至该基座构件与该外盖构件的闩扣杆(lever),其配置成当该外盖构件在该较低位置时转至开位置(open position)、以及当该外盖构件在该较高位置时转至关位置(closed position)以限制集成电路在该基座构件内。


Also published as:
KR1020080024227EP1907868JP2009501340US7108535WO/2007/008754