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1. CN101076867 - Total internal reflection fluorescent (TIRF) microscope

Office
China
Application Number 200580037869.2
Application Date 08.11.2005
Publication Number 101076867
Publication Date 21.11.2007
Publication Kind A
IPC
G12B 21/06
GPHYSICS
12INSTRUMENT DETAILS
BCONSTRUCTIONAL DETAILS OF INSTRUMENTS, OR COMPARABLE DETAILS OF OTHER APPARATUS, NOT OTHERWISE PROVIDED FOR
21Details of apparatus using scanning-probe techniques
02Probes
06Near-field optical probes
G02B 21/08
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21Microscopes
06Means for illuminating specimen
08Condensers
G02B 21/16
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21Microscopes
16adapted for ultra-violet illumination
CPC
G02B 21/082
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21Microscopes
06Means for illuminating specimens
08Condensers
082for incident illumination only
G02B 21/16
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21Microscopes
16adapted for ultra-violet illumination ; ; Fluorescence microscopes
Applicants Imperial Innovation Tech Ltd.
帝国创新技术有限公司
Inventors Ferenczi M. A.
M·A·费伦齐
Agents zhaorong min
北京纪凯知识产权代理有限公司
Priority Data 0424652.6 08.11.2004 GB
Title
(EN) Total internal reflection fluorescent (TIRF) microscope
(ZH) 全内反射荧光(TIRF)显微镜
Abstract
(EN) A total internal reflection fluorescent (TIRF) microscope has a conjugate lens (30) which is positioned off of the primary microscope axis (AA). The lens (30) is held by a mount (60) allowing the radial spacing between the microscope axis (AA) and the conjugate lens axis (BB) to be varied. The mount (60) also allows the lens to be rotated around the microscope axis. As the lens (30) rotates, the spot of light (64) created by the incident laser beam moves around the periphery of the objective lens (34). This changes the direction of polarisation of the evanescent wave within which the sample (44) sits. By studying the emitted fluorescence as a function of lens angle, information is provided about the spatial attitude of a molecule under study.
(ZH)

一种全内反射荧光(TIRF)显微镜具有共轭透镜30,其被放置在偏离主显微镜轴AA的位置。透镜30被载片固定,以使显微镜轴AA和共轭透镜轴BB之间的径向间距可被改变。载片60还使透镜绕显微镜轴旋转。当透镜30旋转时,由入射激光束产生的光斑64绕物镜34的圆周移动。这改变了隐失波的极化方向,样本44位于隐失波中。通过将发射的荧光作为透镜角的函数进行研究,可提供有关研究中的分子的空间姿态的信息。