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1. CN111245530 - 一种高速链路系统的测试装置及方法

Office China
Application Number 201811445288.8
Application Date 29.11.2018
Publication Number 111245530
Publication Date 05.06.2020
Publication Kind A
IPC
H04B 17/20
HELECTRICITY
04ELECTRIC COMMUNICATION TECHNIQUE
BTRANSMISSION
17Monitoring; Testing
20of receivers
H04B 17/309
HELECTRICITY
04ELECTRIC COMMUNICATION TECHNIQUE
BTRANSMISSION
17Monitoring; Testing
30of propagation channels
309Measuring or estimating channel quality parameters
H04L 27/04
HELECTRICITY
04ELECTRIC COMMUNICATION TECHNIQUE
LTRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
27Modulated-carrier systems
02Amplitude-modulated carrier systems, e.g. using on/off keying; Single sideband or vestigial sideband modulation
04Modulator circuits; Transmitter circuits
Applicants 中兴通讯股份有限公司
Inventors 刘春伟
Agents 上海晨皓知识产权代理事务所(普通合伙) 31260
Title
(ZH) 一种高速链路系统的测试装置及方法
Abstract
(ZH)
本发明提出了一种高速链路系统的测试装置,包括:芯片测试器件、传输插入损耗ISI衰减器件、串扰ISI衰减器件和串扰XTK测试器件;所述XTK测试器件,用于将接收到的串扰测试信号在接收到的传输测试信号中形成串扰信号,并将承载所述串扰信号的传输测试信号传输至所述芯片测试器件;所述芯片测试器件,还用于对承载所述串扰信号的传输测试信号的质量参数进行测试评估。本发明还公开了一种高速链路系统的测试方法,通过实施上述方案,有效提高了对承载串扰信号的传输测试信号的质量参数测试评估精度;简化了对承载串扰信号的传输测试信号的质量参数测试评估步骤,提高了对承载串扰信号的传输测试信号的质量参数测试评估效率。

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