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1. CN110697779 - Friction regulation and control method for molybdenum disulfide, device and system

Office
China
Application Number 201910899712.4
Application Date 23.09.2019
Publication Number 110697779
Publication Date 17.01.2020
Grant Number 110697779
Grant Date 15.01.2021
Publication Kind B
IPC
C01G 39/06
CCHEMISTRY; METALLURGY
01INORGANIC CHEMISTRY
GCOMPOUNDS CONTAINING METALS NOT COVERED BY SUBCLASSES C01D OR C01F94
39Compounds of molybdenum
06Sulfides
G01Q 60/26
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY
60Particular types of SPM or apparatus therefor; Essential components thereof
24AFM or apparatus therefor, e.g. AFM probes
26Friction force microscopy
G01Q 30/02
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY
30Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
02Non-SPM analysing devices, e.g. SEM , spectrometer or optical microscope
H02N 1/04
HELECTRICITY
02GENERATION, CONVERSION, OR DISTRIBUTION OF ELECTRIC POWER
NELECTRIC MACHINES NOT OTHERWISE PROVIDED FOR
1Electrostatic generators or motors using a solid moving electrostatic charge carrier
04Friction generators
CPC
C01G 39/06
CCHEMISTRY; METALLURGY
01INORGANIC CHEMISTRY
GCOMPOUNDS CONTAINING METALS NOT COVERED BY SUBCLASSES C01D OR C01F
39Compounds of molybdenum
06Sulfides
G01Q 30/02
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
30Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
02Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope
G01Q 60/26
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
60Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
24AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
26Friction force microscopy
H02N 1/04
HELECTRICITY
02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
NELECTRIC MACHINES NOT OTHERWISE PROVIDED FOR
1Electrostatic generators or motors using a solid moving electrostatic charge carrier
04Friction generators
Applicants TSINGHUA UNIVERSITY
清华大学
Inventors LIU DAMENG
刘大猛
FANG LIANG
房亮
PANG HUA
庞华
LUO JIANBIN
雒建斌
Agents 北京三友知识产权代理有限公司 11127
北京三友知识产权代理有限公司 11127
Title
(EN) Friction regulation and control method for molybdenum disulfide, device and system
(ZH) 二硫化钼的摩擦调控方法、装置及系统
Abstract
(EN)
The invention provides a friction regulation and control method for molybdenum disulfide, a device and a system. The method comprises the steps: acquiring frictional force data of friction pairs corresponding to molybdenum disulfide under different electron beam irradiating conditions, wherein the different electron beam irradiating conditions comprise different accelerating voltage conditions anddifferent electron-beam current conditions; acquiring friction feature data of the molybdenum disulfide according to the frictional force data of the friction pairs corresponding to the molybdenum disulfide under the different electron beam irradiating conditions; and controlling an electron beam to irradiate the molybdenum disulfide based on friction features of the molybdenum disulfide after atarget frictional force of the molybdenum disulfide is acquired, so as to regulate and control the frictional force of a friction pair corresponding to the molybdenum disulfide to the target frictional force. According to the friction regulation and control method for molybdenum disulfide, the device and the system, friction regulation and control on molybdenum disulfide can be carried out, the interference resulting from an electrostatic force is avoided, and the accuracy is high.

(ZH)
本发明提供了一种二硫化钼的摩擦调控方法、装置及系统,该方法包括:获得不同电子束照射条件下二硫化钼对应的摩擦副的摩擦力数据,所述不同电子束照射条件包括不同的加速电压条件和不同的电子束电流条件;根据不同电子束照射条件下二硫化钼对应的摩擦副的摩擦力数据,获得二硫化钼的摩擦特征数据;在获得二硫化钼的目标摩擦力后,基于二硫化钼的摩擦特征,控制电子束照射二硫化钼,以调控二硫化钼对应的摩擦副的摩擦力至目标摩擦力。本发明可以对二硫化钼进行摩擦调控,避免静电力的干扰,准确度高。

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