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1. CN110383074 - AUTOMATIC ANALYSIS DEVICE

Office
China
Application Number 201880005683.6
Application Date 12.01.2018
Publication Number 110383074
Publication Date 25.10.2019
Publication Kind A
IPC
G01N 35/02
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
35Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/-G01N33/148; Handling materials therefor
02using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
CPC
G01N 21/11
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
01Arrangements or apparatus for facilitating the optical investigation
11Filling or emptying of cuvettes
G01N 21/253
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
17Systems in which incident light is modified in accordance with the properties of the material investigated
25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
251Colorimeters; Construction thereof
253for batch operation, i.e. multisample apparatus
G01N 21/274
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
17Systems in which incident light is modified in accordance with the properties of the material investigated
25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
27using photo-electric detection
274Calibration, base line adjustment, drift correction
G01N 35/0092
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
35Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
00584Control arrangements for automatic analysers
0092Scheduling
G01N 35/025
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
35Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
02using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
025having a carousel or turntable for reaction cells or cuvettes
G01N 35/04
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
35Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
02using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
04Details of the conveyor system
Applicants HITACHI HIGH-TECHNOLOGIES CORPORATION
株式会社日立高新技术
Inventors NAKASAWA TAKASHI
中泽隆史
KAWAHARA TETSUJI
川原铁士
NISHIDA MASAHARU
西田正治
INOUE YOKO
井上阳子
YAGI KENICHI
八木贤一
MATSUMOTO OSAMU
松本修
ASADA SAYAKA
朝田沙耶佳
Agents 北京银龙知识产权代理有限公司 11243
北京银龙知识产权代理有限公司 11243
Priority Data 2017-009086 23.01.2017 JP
Title
(EN) AUTOMATIC ANALYSIS DEVICE
(ZH) 自动分析装置
Abstract
(EN)
Provided is an automatic analysis device that automatically executes, while analysis is being performed, necessary maintenance without requiring an operator to stop analysis by the device in order toimplement maintenance of a reaction container. Maintenance for keeping the reaction container clean is necessary to secure the reliability of absorbance data, but since it takes 30 minutes or longer to implement the maintenance, a problem of longer operating time arises. This automatic analysis device includes a memory unit for memorizing, in units of days, reaction containers to be cleaned such that all of the reaction containers placed on a reaction disc in a plurality of days are to be cleaned. A control unit performs control such that, in an operation state after samples to be analyzed aredispensed to the reaction containers, the samples to be analyzed in the respective reaction containers are analyzed, and the samples are not dispensed to reaction containers to be cleaned on a day stored in the memory unit, but detergents are dispensed thereto so that the reaction containers are cleaned while being soaked for a predetermined period of time. The number of reaction containers to becleaned per day can be varied depending on how long a time, during which analysis process capability of the device is reduced, is allowed, whereby the device can be usable in various facilities.

(ZH)
本发明提供一种自动分析装置,操作人员不会为了维护反应容器而停止装置的分析,而是一边进行分析一边自动地执行需要的维护。为了确保吸光度数据的可靠性,必需用于将反应容器保持清洁的维护,但维护需要30分钟以上的时间,有作业时间增大的课题。具备以使在数天内载置于反应盘的所有反应容器成为清洗对象的方式以天为单位地存储清洗对象的反应容器的存储部,控制部控制为,在将成为分析对象的试样分注到该反应容器后的操作状态下,在各个反应容器中分析成为分析对象的试样,向存储于存储部的当天的清洗对象的反应容器分注洗涤剂而不分注试样并进行一定时间的浸泡清洗。并根据装置的分析处理能力降低的时间的允许宽度使每天清洗的反应容器的个数可变,能对应于多种施设。