Processing

Please wait...

Settings

Settings

Goto Application

1. CN110249229 - TEST PROBE AND TEST SOCKET USING THE SAME

Office
China
Application Number 201880009787.4
Application Date 11.01.2018
Publication Number 110249229
Publication Date 17.09.2019
Grant Number 110249229
Grant Date 31.05.2022
Publication Kind B
IPC
G01R 1/067
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types covered by groups G01R5/-G01R13/122
02General constructional details
06Measuring leads; Measuring probes
067Measuring probes
G01R 31/28
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
CPC
G01R 1/0416
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
02General constructional details
04Housings; Supporting members; Arrangements of terminals
0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
0416Connectors, terminals
G01R 1/06722
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
02General constructional details
06Measuring leads; Measuring probes
067Measuring probes
06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
06716Elastic
06722Spring-loaded
G01R 1/06738
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
02General constructional details
06Measuring leads; Measuring probes
067Measuring probes
06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
06733Geometry aspects
06738related to tip portion
G01R 31/2808
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
2806Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
2808Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
Applicants LEENO INDUSTRIAL INC.
李诺工业股份有限公司
Inventors BAEK SEUNG-HA
白承夏
Agents 北京同立钧成知识产权代理有限公司 11205
北京同立钧成知识产权代理有限公司 11205
Title
(EN) TEST PROBE AND TEST SOCKET USING THE SAME
(ZH) 测试探针以及支撑该测试探针的测试插座
Abstract
(EN) Disclosed is a test probe for an object with a barrel-shaped contact terminal having a curved surface. The test probe includes a first contact member configured to comprise a contact portion having a pair of contact surfaces which are arranged in a form of 'V' and respectively contact the contact terminal to be tested at points spaced from each other, and an extended portion integrally extended from the contact portion backward in a lengthwise direction. Thus, the test probe can effectively contacts a partially curved barrel-shaped contact terminal of an object to be tested, such as a subminiature camera module for a smart phone.
(ZH) 本发明公开一种测试探针以及支撑该测试探针的测试插座,用于包括具有弯曲表面的桶状接触端子的物件。所述测试探针包括:第一接触构件,被配置成包括接触部分以及延伸部分,所述接触部分具有一对排列成“V”形且分别在彼此间隔开的点处与所述待测试接触端子接触的接触表面,且所述延伸部分自所述接触部分沿纵向方向向后一体延伸。因此,所述测试探针能有效地与例如用于智能电话的超小型照相机模块的待测试物件的部分弯曲桶形状接触端子接触。根据本发明的实施例的测试探针和测试插座,可以对具有部分弯曲桶状接触端子的照相机模块或类似物件进行稳定检查,藉此有效地处理例如污染、清洁、测试误差等所需的维护等工作。
Related patent documents