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1. CN106574871 - Device and method for characterization of light beam

Office
China
Application Number 112015000041975
Application Date 15.06.2015
Publication Number 106574871
Publication Date 19.04.2017
Grant Number 106574871
Grant Date 16.07.2019
Publication Kind B
IPC
G01J 9/02
GPHYSICS
01MEASURING; TESTING
JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
9Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
02by interferometric methods
G01J 11/00
GPHYSICS
01MEASURING; TESTING
JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
11Measuring the characteristics of individual optical pulses or of optical pulse trains
CPC
G01J 9/0215
GPHYSICS
01MEASURING; TESTING
JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
9Measuring optical phase difference
02by interferometric methods
0215by shearing interferometric methods
G01J 11/00
GPHYSICS
01MEASURING; TESTING
JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
11Measuring the characteristics of individual optical pulses or of optical pulse trains
G01J 3/453
GPHYSICS
01MEASURING; TESTING
JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
3Spectrometry; Spectrophotometry; Monochromators; Measuring colours
28Investigating the spectrum
45Interferometric spectrometry
453by correlation of the amplitudes
G01J 2003/4538
GPHYSICS
01MEASURING; TESTING
JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
3Spectrometry; Spectrophotometry; Monochromators; Measuring colours
28Investigating the spectrum
45Interferometric spectrometry
453by correlation of the amplitudes
4538Special processing
Applicants COMMISSARIAT ENERGIE ATOMIQUE
法国原子能及替代能源委员会
Inventors QUERE FABIEN
法比安·奎尔
GALLET VALENTIN
瓦伦丁·加列特
PARIENTE GUSTAVE
古斯塔夫·帕连特
Agents 中国商标专利事务所有限公司 11234
中国商标专利事务所有限公司 11234
Priority Data 1455472 16.06.2014 FR
Title
(EN) Device and method for characterization of light beam
(ZH) 用于光束表征的设备和方法
Abstract
(EN) One aspect of the invention concerns a method for characterization of a light beam, comprising the following steps: - separation of the light beam by means of a separator optic into a first sub-beam and a second sub-beam; - propagation of the first sub-beam over a first optic and of the second sub-beam over a second optic, the first and second optics being respectively arranged so that the first sub-beam on leaving the first optic, referred to as the "reference beam", and the second sub-beam, on leaving the second optic, referred to as the "characteristized beam", are separated by a time delay Tao sweeping a time interval T1 with step P1; - recombination of the reference beam and the characterized beam by means of a recombiner optic in such a way that the beams spatially interfere and form a two-dimensional interference pattern; - measurement of said two-dimensional interference pattern by means of a measurement system, as a function of the time delay Tao sweeping the time interval T1 with step P1, in order to obtain a temporal interferogram; - calculation of the Fourier transform in the frequency domain of at least one spatial point of the temporal interferogram, said Fourier transform in the frequency domain having a frequency central peak and first and second frequency side peaks; - calculation of the spectral amplitude AR(Omega) and of the space-spectrum phase PhiR(x,y,Omega) for one of said first and second frequency side peaks of said Fourier transform in the frequency domain.
(ZH) 本发明的一方面涉及用于光束表征的方法,包括下列步骤:‑通过分离器光学件分离光束为第一子光束和第二子光束;‑第一子光束传播通过第一光学件,并且第二子光束传播通过第二光学件,分别地设置所述第一和第二光学件,这样称为“参考光束”的离开第一光学件时的第一子光束,以及称为“表征光束”的离开第二光学件时的第二子光束被用步调P1扫描时间间隔T1的时间延迟τ分离;‑通过复合器光学件的参考光束和表征光束的重组,这样光束空间地干涉和形成二维干涉模式;‑根据用步调P1扫描时间间隔T1的时间延迟τ,通过测量系统,所述二维干涉模式的测量,以获得时间干涉图;‑在时间干涉图的至少一个空间点的频域中傅里叶变换的计算,在频域中所述的傅里叶变换具有频率中心峰以及第一和第二频率侧峰;‑对于频域中所述傅里叶变换的所述第一和第二频率侧峰之一,光谱振幅AR(ω)和空间‑光谱相位的计算。
Related patent documents
CN201580041975.1This application is not viewable in PATENTSCOPE because the national phase entry has not been published yet or the national entry is issued from a country that does not share data with WIPO or there is a formatting issue or an unavailability of the application.