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1. AU1999057911 - Electro-optic voltage sensor

Office Australia
Application Number 57911/99
Application Date 31.08.1999
Publication Number 1999057911
Publication Date 11.05.2000
Publication Kind A
IPC
G01R 1/07
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types covered by groups G01R5/-G01R13/122
02General constructional details
06Measuring leads; Measuring probes
067Measuring probes
07Non contact-making probes
G01R 15/24
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
15Details of measuring arrangements of the types provided for in groups G01R17/-G01R29/, G01R33/-G01R33/26176
14Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
24using light-modulating devices
CPC
G01R 15/242
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
15Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00 and G01R33/00 - G01R35/00
14Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
24using light-modulating devices
241using electro-optical modulators, e.g. electro-absorption
242based on the Pockels effect, i.e. linear electro-optic effect
G01R 1/071
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
02General constructional details
06Measuring leads; Measuring probes
067Measuring probes
07Non-contact-making probes
071containing electro-optic elements
Applicants Lockheed Martin Idaho Technologies Company
Inventors Crawford, Thomas M.
Davidson, James R.
Seifert, Gary D.
Priority Data 60098794 01.09.1998 US
Title
(EN) Electro-optic voltage sensor
Abstract
(EN)
An electro-optic voltage sensor system includes a sensor (40) disposed in an E-field, a transmitter (34) for producing the electro-magnetic beam, detectors (162, 164) for converting the two beams into electrical signals and a signal processor (174) for determining the voltage. The sensor (40) receives a source beam (38) and includes a polarization beam displacer (80) for separating the source light beam (38) into two beams with orthogonal linear polarizations, a wave plate (104) for rotating the linear polarization to rotated polarization, a transducer (114) utilizing pockels electro-optic effect for inducing a differential phase shift on the major and minor axes of the rotated polarization in response to the E-field, a prism (130) for redirecting the beam back through the transducer (114) and also converts the rotated polarization to circular or elliptical polarization.

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