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1. CN106526923 - Array substrate, testing method thereof and display device

Office China
Application Number 201710022521.0
Application Date 12.01.2017
Publication Number 106526923
Publication Date 22.03.2017
Grant Number 106526923
Grant Date 23.04.2019
Publication Kind B
IPC
G02F 1/13
GPHYSICS
02OPTICS
FDEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH IS MODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THE DEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY, COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g. SWITCHING, GATING, MODULATING OR DEMODULATING; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF; FREQUENCY-CHANGING; NON-LINEAR OPTICS; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
1Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
01for the control of the intensity, phase, polarisation or colour
13based on liquid crystals, e.g. single liquid crystal display cells
CPC
G02F 1/1309
GPHYSICS
02OPTICS
FDEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH IS MODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THE DEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY, COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g. SWITCHING, GATING, MODULATING OR DEMODULATING; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF; FREQUENCY-CHANGING; NON-LINEAR OPTICS; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
1Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating, or modulating; Non-linear optics
01for the control of the intensity, phase, polarisation or colour 
13based on liquid crystals, e.g. single liquid crystal display cells
1306Details
1309Repairing; Testing
Applicants BOE TECHNOLOGY GROUP CO., LTD.
京东方科技集团股份有限公司
CHENGDU BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
成都京东方光电科技有限公司
Inventors ZHANG ZIHE
张子鹤
JI BIN
季斌
LI JIANJUN
李建军
Agents 北京风雅颂专利代理有限公司 11403
北京风雅颂专利代理有限公司 11403
Title
(EN) Array substrate, testing method thereof and display device
(ZH) 阵列基板、其测试方法及显示装置
Abstract
(EN)
The embodiment of the invention discloses an array substrate, a testing method thereof and a display device. The array substrate comprises a driving chip and at least one pixel unit. Each pixel unit comprises an output circuit. The first end of the output circuit is connected to the output end of the driving chip, and a testing circuit same as the output circuit is arranged beyond the effective display area of the array substrate. The first end of the testing circuit is connected to the second end of the output circuit, and the second end of the testing circuit is connected to the testing end of the driving chip. According to the array substrate and the testing method and display device thereof, when the testing circuit same as the general output circuit is arranged on the array substrate of a display panel, the output circuit is connected with the testing circuit in series, accordingly, the transmission delay measurement between the two ends of the output circuit is transformed into the transmission delay measurement between the connection end of the output circuit and the driving chip and the connection end of the testing circuit and the driving chip, and the problem that a signal of the end, far away from the driving chip, of the output circuit is difficult to actually measure is solved.

(ZH)
本发明实施例公开了一种阵列基板、其测试方法及显示装置,包括驱动芯片和至少一个像素单元,所述像素单元包括输出线路,所述输出线路的第一端连接至所述驱动芯片的输出端,所述阵列基板有效显示区域外,设置与所述输出线路相同的测试线路;所述测试线路的第一端连接至所述输出线路的第二端,所述测试线路的第二端连接至所述驱动芯片的测试端。本发明实施例通过在显示面板的阵列基板上,设置一条与普通输出线路相同的测试线路,将输出线路与测试线路串联,从而将输出线路两端传输延迟的测量转化为输出线路和测试线路各自与驱动芯片连接端之间传输延迟的测量,解决了输出线路远离驱动芯片端信号难以实际测量的问题。