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1. CN101556382 - TFT-LCD array substrate and methods for manufacturing and testing same

Office China
Application Number 200810103787.9
Application Date 10.04.2008
Publication Number 101556382
Publication Date 14.10.2009
Grant Number 101556382
Grant Date 13.04.2011
Publication Kind B
IPC
G02F 1/13
GPHYSICS
02OPTICS
FDEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH IS MODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THE DEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY, COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g. SWITCHING, GATING, MODULATING OR DEMODULATING; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF; FREQUENCY-CHANGING; NON-LINEAR OPTICS; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
1Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
01for the control of the intensity, phase, polarisation or colour
13based on liquid crystals, e.g. single liquid crystal display cells
G02F 1/1362
GPHYSICS
02OPTICS
FDEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH IS MODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THE DEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY, COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g. SWITCHING, GATING, MODULATING OR DEMODULATING; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF; FREQUENCY-CHANGING; NON-LINEAR OPTICS; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
1Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
01for the control of the intensity, phase, polarisation or colour
13based on liquid crystals, e.g. single liquid crystal display cells
133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
136Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
1362Active matrix addressed cells
H01L 27/12
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
27Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
02including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
12the substrate being other than a semiconductor body, e.g. an insulating body
H01L 21/84
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
21Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
70Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in or on a common substrate or of specific parts thereof; Manufacture of integrated circuit devices or of specific parts thereof
77Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
78with subsequent division of the substrate into plural individual devices
82to produce devices, e.g. integrated circuits, each consisting of a plurality of components
84the substrate being other than a semiconductor body, e.g. being an insulating body
Applicants Beijing BOE Optoelectronics Technology Co., Ltd.
北京京东方光电科技有限公司
Inventors Zhang Mi
张弥
Peng Zhilong
彭志龙
Agents liu fang
北京同立钧成知识产权代理有限公司 11205
Title
(EN) TFT-LCD array substrate and methods for manufacturing and testing same
(ZH) TFT-LCD阵列基板及其制造方法和测试方法
Abstract
(EN)
The invention relates to a TFT-LCD array substrate and methods for manufacturing and testing the same. The TFT-LCD array substrate comprises a display area and a peripheral area, wherein the display area is internally provided with a grid line and a data line, and the peripheral area is internally provided with a test line and a binding point for connecting the test line with the grid line and/or connecting the test line with the data line. The method for testing the TFT-LCD array substrate comprises the following steps: connecting a signal line to be tested with the test line at the binding point in a laser welding way, and testing the signal line to be tested through the test line. Because the test line and the binding point are formed in the peripheral area, and the signal line to be tested is connected with the test line at the binding point in a laser welding way in the TFT-LCD array substrate testing process, a signal on the signal line can be tested, the test and analysis way of the liquid crystal panel can be strengthened and the comprehensive analysis ability of a TFT-LCD is improved.

(ZH)

本发明涉及一种TFT-LCD阵列基板及其制造方法和测试方法。TFT-LCD阵列基板包括显示区域和外围区域,显示区域内设置有栅线和数据线,外围区域内设置有测试线,以及在测试时将测试线与栅线连接和/或将测试线与数据线连接的结合点。TFT-LCD阵列基板的测试方法包括:通过激光焊接方式,在结合点位置将待测信号线与测试线连接;通过测试线对所述待测信号线进行测试。本发明通过在外围区域形成测试线和结合点,在测试时采用激光焊接方法建立测试线与信号线之间的连接即可实现信号线上信号的测试,增强了液晶面板的测试分析途径,提高了TFT-LCD性能的综合分析能力。