1. WO2026174499 - MULTI-TURN POSITION SENSING DEVICE AND MULTI-TURN POSITION SENSING METHOD

Publication Number WO/2026/174499

Publication Date 27.08.2026

International Application No. PCT/CN2025/078313

International Filing Date 20.02.2025

IPC

G01D 5/12 2006.1

G	PHYSICS
01	MEASURING; TESTING
D	MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; TRANSFERRING OR TRANSDUCING ARRANGEMENTS NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
5	Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
12	using electric or magnetic means

G01D 5/14 2006.1

G	PHYSICS
01	MEASURING; TESTING
D	MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; TRANSFERRING OR TRANSDUCING ARRANGEMENTS NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
5	Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
12	using electric or magnetic means
14	influencing the magnitude of a current or voltage

G01B 7/30 2006.1

G	PHYSICS
01	MEASURING; TESTING
B	MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
7	Measuring arrangements characterised by the use of electric or magnetic techniques
30	for measuring angles or tapers; for testing the alignment of axes

G01D 5/12 2006.1

G	PHYSICS
01	MEASURING; TESTING
D	MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; TRANSFERRING OR TRANSDUCING ARRANGEMENTS NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
5	Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
12	using electric or magnetic means

G01D 5/14 2006.1

G	PHYSICS
01	MEASURING; TESTING
D	MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; TRANSFERRING OR TRANSDUCING ARRANGEMENTS NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
5	Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
12	using electric or magnetic means
14	influencing the magnitude of a current or voltage

G01B 7/30 2006.1

G	PHYSICS
01	MEASURING; TESTING
B	MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
7	Measuring arrangements characterised by the use of electric or magnetic techniques
30	for measuring angles or tapers; for testing the alignment of axes

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Applicants

• 台达电子工业股份有限公司 DELTA ELECTRONICS, INC. [CN]/[CN]

Inventors

• 王宏洲 WANG, Horng-Jou
• 林正平 LIN, Jeng-Ping
• 蔡侑樵 TSAI, You-Chyau
• 吕杰锽 LU, Chieh-Huang

Agents

• 北京同立钧成知识产权代理有限公司 LEADER PATENT & TRADEMARK FIRM

Priority Data

Publication Language Chinese (zh)

Filing Language Chinese (zh)

Designated States

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AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CV, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IQ, IR, IS, IT, JM, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, MG, MK, MN, MU, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UY, UZ, VC, VN, WS, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, CV, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SC, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, ME, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)

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Title

(EN) MULTI-TURN POSITION SENSING DEVICE AND MULTI-TURN POSITION SENSING METHOD

(FR) DISPOSITIF DE DÉTECTION DE POSITION MULTITOUR ET PROCÉDÉ DE DÉTECTION DE POSITION MULTITOUR

(ZH) 多圈位置感测装置及多圈位置感测方法

Abstract

(EN) A multi-turn position sensing device, comprising a rotating component, wherein the rotating component comprises a magnet (MG) and a rotating shaft (RS); a first multi-turn position sensor (MT1); a second multi-turn position sensor (MT2); and a signal processor (SPR), the signal processor (SPR) being coupled to the first multi-turn position sensor (MT1) and the second multi-turn position sensor (MT2), and being configured to execute the following steps: acquiring first position information of the first multi-turn position sensor (MT1) in respect of the rotating shaft (RS); acquiring second position information of the second multi-turn position sensor (MT2) in respect of the rotating shaft (RS); and performing a signal processing procedure on the first position information and the second position information to generate corresponding first long-stroke position information. Also provided is a multi-turn position sensing method.

(FR) L'invention concerne un dispositif de détection de position multitour, comprenant un composant rotatif, le composant rotatif comprenant un aimant (MG) et un arbre rotatif (RS) ; un premier capteur de position multitour (MT1) ; un second capteur de position multitour (MT2) ; et un processeur de signal (SPR), le processeur de signal (SPR) étant couplé au premier capteur de position multitour (MT1) et au second capteur de position multitour (MT2), et étant configuré pour exécuter les étapes suivantes consistant à : acquérir des premières informations de position du premier capteur de position multitour (MT1) par rapport à l'arbre rotatif (RS) ; acquérir des secondes informations de position du second capteur de position multitour (MT2) par rapport à l'arbre rotatif (RS) ; et effectuer une procédure de traitement de signal sur les premières informations de position et les secondes informations de position pour générer des premières informations de position de longue course correspondantes. L'invention concerne également un procédé de détection de position multitour.

(ZH) 一种多圈位置感测装置，包含旋转部件，旋转部件包含磁石（MG）及旋转轴（RS）；第一多圈位置传感器（MT1）；第二多圈位置传感器（MT2）；信号处理器（SPR），信号处理器（SPR）耦接于第一多圈位置传感器（MT1）及第二多圈位置传感器（MT2），并用以执行以下步骤：对旋转轴（RS）获取第一多圈位置传感器（MT1）的第一位置信息；对旋转轴（RS）获取第二多圈位置传感器（MT2）的第二位置信息；将第一位置信息与第二位置信息进行信号处理程序产生对应的第一长行程位置信息。还提供一种多圈位置感测方法。

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