Processing

Please wait...

Settings

Settings

Goto Application

1. WO2020140765 - TESTING CIRCUIT AND TESTING METHOD FOR MEMORY

CN111383705Test circuit and test method of a memory
Appl.Date 30.12.2018
Appl.No 201811648942.5 Applicant CETHIK GROUP CO., LTD. Pub.Kind A
Inclusion Criteria IC5
Sole priority inside the family.
Pub.Date 07.07.2020
WO/2020/140765TESTING CIRCUIT AND TESTING METHOD FOR MEMORY
Appl.Date 19.12.2019
Appl.No PCT/CN2019/126747 Applicant ZHEJIANG HIKSTOR TECHNOLOGY CO., LTD. Pub.Kind A Pub.Lang zh
Inclusion Criteria IC1
PCT application from which the family originated.
Pub.Date 09.07.2020